Sub-2 nm Equivalent-Oxide-Thickness Ferroelectric Transistors for Cryogenic Memory and Computing

cycles, and retention projections consistent with decade-scale stability. Correlative four-dimensional scanning transmission electron microscopy phase mapping reveals an increased orthorhombic ferroelectric fraction following electrical wake-up at cryogenic temperatures, correlated with enhanced polarization stability and strengthened oxygen-metal coordination. We hypothesize that suppressed trapping-related instability, along with a higher orthorhombic phase, jointly contribute to this effect. Current-voltage sweeps define an operational design window, with memory-window saturation beyond ±5 V programming voltages and ≳900 ns pulse widths, consistent with nucleation-limited reversal kinetics in ultrathin films. A spiking neural network implemented at 10 K achieves >92% classification accuracy on MNIST and 73.8% accuracy on NMNIST data sets, demonstrating practical utility. These findings provide materials- and device-level insights into scaled hafnia FeFETs for energy-efficient cryogenic applications, including potential integration in quantum-classical systems.

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Publication Details

Journal
ACS Nano
Published
2026-03-31
DOI
https://doi.org/10.1021/acsnano.5c16255
Citations
1
Primary Topic
Ferroelectric and Negative Capacitance Devices
Type
article
Field-Weighted Citation Impact
11.21

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article

Sub-2 nm Equivalent-Oxide-Thickness Ferroelectric Transistors for Cryogenic Memory and Computing

Gautham Kumar, Yannick Raffel, Sandip Lashkare, Ankit Agarwal et al.
1 citations
ACS Nano
Ferroelectric and Negative Capacitance Devices
11.21
article

Sub-2 nm Equivalent-Oxide-Thickness Ferroelectric Transistors for Cryogenic Memory and Computing

Gautham Kumar, Yannick Raffel, Sandip Lashkare, Ankit Agarwal, Darsen D. Lu, Guilhem Larrieu, Kuo-Hsing Kao, Sourav De, Asim Senapati, Apu Das, Jaskirat Singh Maskeen, Agniva Paul, Mohit Tewari, Siddheswar Maikap, Jonas Müller, Min-Hung Lee, Tarun Agarwal, Zhao-Feng Lou
article en
1 citations

Abstract

cycles, and retention projections consistent with decade-scale stability. Correlative four-dimensional scanning transmission electron microscopy phase mapping reveals an increased orthorhombic ferroelectric fraction following electrical wake-up at cryogenic temperatures, correlated with enhanced polarization stability and strengthened oxygen-metal coordination. We hypothesize that suppressed trapping-related instability, along with a higher orthorhombic phase, jointly contribute to this effect. Current-voltage sweeps define an operational design window, with memory-window saturation beyond ±5 V programming voltages and ≳900 ns pulse widths, consistent with nucleation-limited reversal kinetics in ultrathin films. A spiking neural network implemented at 10 K achieves >92% classification accuracy on MNIST and 73.8% accuracy on NMNIST data sets, demonstrating practical utility. These findings provide materials- and device-level insights into scaled hafnia FeFETs for energy-efficient cryogenic applications, including potential integration in quantum-classical systems.

ACS NanoVol. 20(14)
Semiconductor Research Corporation (US), National Taiwan University (TW), Chang Gung University (TW), Université Fédérale de Toulouse Midi-Pyrénées (FR), Laboratoire d'Analyse et d'Architecture des Systèmes (FR), National Tsing Hua University (TW), Indian Institute of Technology Gandhinagar (IN), Fraunhofer Institute for Photonic Microsystems (DE), Institute of Electronics (BG), National Cheng Kung University (TW)
Arthritis National Research Foundation, National Research Foundation, Centre National de la Recherche Scientifique, Thailand Science Research and Innovation, National Science and Technology Council
Affordable and clean energy
Openalex Percentile: Top 2%
Ferroelectric and Negative Capacitance Devices
11.21
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