Metodutveckling för kvantifiering av grafen på ytor

The use of graphene-based materials is rapidly increasing in both industrial and research settings, raising concerns about potential exposure risks for personnel. Despite this, there are currently no standardized methods for detecting and quantifying graphene. This study presents a practically applicable method for collecting and analysing graphene residues from solid surfaces, based on wet sampling combined with UV-Vis spectroscopy and scanning electron microscopy (SEM). Several sampling techniques and solvents were tested, and a functional method was developed using mechanical sampling in combination with a water-based SDS solution. UV-Vis spectroscopy was used to detect the characteristic absorbance around 270 nm, while SEM confirmed the presence of graphene-like particles on the surfaces. Graphene could thereby be detected in controlled reference samples prepared with added graphene, whereas no distinct graphene-related signal exceeding the practical detection threshold was observed in field samples. The method was also tested in environments with actual exposure, where UV-Vis results were interpreted alongside thermal-optical analysis to support the presence of carbonaceous material. The study demonstrates that the combination of SDS-based sampling and UV-Vis spectroscopy offers an accessible and scalable approach for detecting graphene-related material on surfaces. However, the applicability of the method is limited by its practical detection threshold, as transferred concentrations under low-exposure conditions may fall below the minimum measurable level. Future research should focus on calibration models, determination of detection limits in relation to relevant particulate exposure levels, a broader range of surface types, and complementary techniques such as Raman and XPS to further confirm the material’s identity. The method is relevant to occupational safety, environmental monitoring, and the future standardization of surface contamination assessments.