First‐Principles Investigation of Surface‐Induced Effects on the Properties of Divacancy Qubits in 3C‐SiC

Neutral silicon‐carbon divacancies (V Si ) in cubic silicon carbide (3C‐SiC) are promising point defects for quantum technologies based on active crystalline centers. Within the theoretical framework of spin‐polarized density functional theory, this study examines the structural and electronic characteristics of V Si centers near a hydrogen‐terminated 3C‐SiC(001) surface. A (2 × 1): H reconstructed slab of 628 atoms represents the near‐surface environment, with divacancies located at depths ranging from 0.6 to 1.2 nm in basal and axial orientations. The optimized geometries show localized relaxations, and the electronic structure reveals in‐gap defect levels in both spin channels. Furthermore, examination of the zero‐field splitting tensor demonstrates sensitivity to the orientation of the spin defects and their distance from the surface. The findings of this investigation suggest that surface proximity exerts a substantial influence on the spin Hamiltonian of divacancies, providing insight for the engineering of SiC‐based qubits and nanoscale quantum devices.

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Publication Details

Journal
physica status solidi (b)
Published
2026-03-01
DOI
https://doi.org/10.1002/pssb.202500612
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
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article

First‐Principles Investigation of Surface‐Induced Effects on the Properties of Divacancy Qubits in 3C‐SiC

Rosario G. Viglione, Antonino La Magna, G. Castorina, Gaetano Calogero et al.
physica status solidi (b)
Silicon Carbide Semiconductor Technologies
article

First‐Principles Investigation of Surface‐Induced Effects on the Properties of Divacancy Qubits in 3C‐SiC

Rosario G. Viglione, Antonino La Magna, G. Castorina, Gaetano Calogero, Damiano Ricciarelli, Ioannis Deretzis, Giuseppe Fisicaro
article en

Abstract

Neutral silicon‐carbon divacancies (V Si ) in cubic silicon carbide (3C‐SiC) are promising point defects for quantum technologies based on active crystalline centers. Within the theoretical framework of spin‐polarized density functional theory, this study examines the structural and electronic characteristics of V Si centers near a hydrogen‐terminated 3C‐SiC(001) surface. A (2 × 1): H reconstructed slab of 628 atoms represents the near‐surface environment, with divacancies located at depths ranging from 0.6 to 1.2 nm in basal and axial orientations. The optimized geometries show localized relaxations, and the electronic structure reveals in‐gap defect levels in both spin channels. Furthermore, examination of the zero‐field splitting tensor demonstrates sensitivity to the orientation of the spin defects and their distance from the surface. The findings of this investigation suggest that surface proximity exerts a substantial influence on the spin Hamiltonian of divacancies, providing insight for the engineering of SiC‐based qubits and nanoscale quantum devices.

physica status solidi (b)Vol. 263(3)
Institute for Microelectronics and Microsystems (IT)
Industry, innovation and infrastructure
Openalex Percentile: Top 5%
Silicon Carbide Semiconductor Technologies
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First‐Principles Investigation of Surface‐Induced Effects on the Properties of Divacancy Qubits in 3C‐SiC — Rosario G. Viglione, Antonino La Magna, et al. · physica status solidi (b) (2026) | TGRS Research Map | TGRS