Evaluating and Enhancing YOLOv8’s Soft Error Resilience

Soft errors pose a critical reliability threat to deep neural networks in safety-critical systems. We present YOLO-FI, a fault injection framework for YOLO models that supports module-wise analysis, multiple formats, and customizable fault models. Using YOLO-FI, we evaluate YOLOv8 in floating- and fixed-point forms on COCO. Results show that floating-point YOLOv8 is vulnerable across modules, while fixed-point models are resilient except for the final module. Range restriction improves resilience in most floating-point modules but fails in the final one. To address this, we propose selective hardening of the vulnerable module, achieving effective fault mitigation with modest overhead.

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Publication Details

Journal
Electronics
Published
2026-03-27
DOI
https://doi.org/10.3390/electronics15071404
Primary Topic
Radiation Effects in Electronics
Type
article
Field-Weighted Citation Impact
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Evaluating and Enhancing YOLOv8’s Soft Error Resilience

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Radiation Effects in Electronics
article

Evaluating and Enhancing YOLOv8’s Soft Error Resilience

Jinrong Shen, Zhi Liu, Aonan Yang, Tan Tan, Yihao Guan
article en

Abstract

Soft errors pose a critical reliability threat to deep neural networks in safety-critical systems. We present YOLO-FI, a fault injection framework for YOLO models that supports module-wise analysis, multiple formats, and customizable fault models. Using YOLO-FI, we evaluate YOLOv8 in floating- and fixed-point forms on COCO. Results show that floating-point YOLOv8 is vulnerable across modules, while fixed-point models are resilient except for the final module. Range restriction improves resilience in most floating-point modules but fails in the final one. To address this, we propose selective hardening of the vulnerable module, achieving effective fault mitigation with modest overhead.

ElectronicsVol. 15(7)
Hohai University (CN), Jiangsu University of Technology (CN)
Climate action
Openalex Percentile: Top 5%
Radiation Effects in Electronics
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