Partial coherence of inelastically scattered electrons in transmission electron microscopy

Coherence of electron waves is central to transmission electron microscopy. However, the mechanism underlying partial loss of coherence during inelastic scattering has been a perplexing problem for many decades. Here we show that the inelastic collision time is the key parameter governing coherence. Large energy transfers have short collision times and an inversely decaying coherence length. It is also shown that the inelastic coherence volume is highly elongated along the electron beam direction. Plasmon excitation and inter-band transition events therefore have only a minor effect on dynamical diffraction, a fact confirmed by energy filtered measurements on [001]-oriented SrTiO3.

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Publication Details

Journal
Microscopy
Published
2026-03-20
DOI
https://doi.org/10.1093/jmicro/dfag020
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
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article

Partial coherence of inelastically scattered electrons in transmission electron microscopy

Budhika Gehan Mendis
Microscopy
Advanced Electron Microscopy Techniques and Applications
article

Partial coherence of inelastically scattered electrons in transmission electron microscopy

Budhika Gehan Mendis
article en

Abstract

Coherence of electron waves is central to transmission electron microscopy. However, the mechanism underlying partial loss of coherence during inelastic scattering has been a perplexing problem for many decades. Here we show that the inelastic collision time is the key parameter governing coherence. Large energy transfers have short collision times and an inversely decaying coherence length. It is also shown that the inelastic coherence volume is highly elongated along the electron beam direction. Plasmon excitation and inter-band transition events therefore have only a minor effect on dynamical diffraction, a fact confirmed by energy filtered measurements on [001]-oriented SrTiO3.

Microscopy
Durham University (GB)
Affordable and clean energy
Openalex Percentile: Top 6%
Advanced Electron Microscopy Techniques and Applications
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