Ensemble Learning Using YOLO Models for Semiconductor E-Waste Recycling

The global rise in electronic waste (e-waste), especially in semiconductor components such as circuit boards and microchips, underscores a critical need for improved recycling technology. Current industrial sorters often miss small, high-value components. This leads to the loss of precious metals and inefficient recycling processes. This paper introduces an automated detection framework for detecting semiconductor components in e-waste. It assesses ensemble learning methods that leverage the strengths of multiple YOLO (You Only Look Once) object detection models, including YOLOv5, YOLOv8, YOLOv9, YOLOv10, YOLOv11, and YOLOv12. Three ensemble fusion strategies are systematically compared: standard Non-Maximum Suppression (NMS), voting-based strategies (Affirmative, Consensus, Unanimous), and Weighted Box Fusion (WBF) with both static and dynamic weight optimization. Our simulations demonstrate that using multiple models together is far more effective than a single model for the following reasons. 1. Higher Accuracy: The best configuration, Top-4 Consensus Voting ensemble strategy, achieved an [email protected] of 59.63%, a 10.3% improvement over the best individual model (YOLOv8s, 54.04%); 2. Greater Reliability: It significantly reduced “false negatives” (missed detections), even in cluttered or crowded e-waste scenarios; 3. Enhanced Detection: While the individual YOLOv8 model is fast (taking only 62.6 ms), supporting real-time detection, the best ensemble configuration (Consensus Top-4) takes 384.9 ms, creating a trade-off between detection accuracy and speed; 4. Well-Balanced Performance: Some fusion strategies showed slight trade-offs in mAP for certain parts, but collectively achieved a 7% rise in F1-score, indicating a better balance between precision and recall. This research marks significant progress in smart recycling. Improved component identification allows for more efficient recovery of high-purity materials. This promotes a circular economy by ensuring that rare and strategic materials in electronics are reused instead of discarded.

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Published
2026-03-26
DOI
https://doi.org/10.3390/info17040322
Primary Topic
Advanced Neural Network Applications
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article

Ensemble Learning Using YOLO Models for Semiconductor E-Waste Recycling

Sos С. Agaian, Xinglong Zhou
Information
Advanced Neural Network Applications
article

Ensemble Learning Using YOLO Models for Semiconductor E-Waste Recycling

Sos С. Agaian, Xinglong Zhou
article en

Abstract

The global rise in electronic waste (e-waste), especially in semiconductor components such as circuit boards and microchips, underscores a critical need for improved recycling technology. Current industrial sorters often miss small, high-value components. This leads to the loss of precious metals and inefficient recycling processes. This paper introduces an automated detection framework for detecting semiconductor components in e-waste. It assesses ensemble learning methods that leverage the strengths of multiple YOLO (You Only Look Once) object detection models, including YOLOv5, YOLOv8, YOLOv9, YOLOv10, YOLOv11, and YOLOv12. Three ensemble fusion strategies are systematically compared: standard Non-Maximum Suppression (NMS), voting-based strategies (Affirmative, Consensus, Unanimous), and Weighted Box Fusion (WBF) with both static and dynamic weight optimization. Our simulations demonstrate that using multiple models together is far more effective than a single model for the following reasons. 1. Higher Accuracy: The best configuration, Top-4 Consensus Voting ensemble strategy, achieved an [email protected] of 59.63%, a 10.3% improvement over the best individual model (YOLOv8s, 54.04%); 2. Greater Reliability: It significantly reduced “false negatives” (missed detections), even in cluttered or crowded e-waste scenarios; 3. Enhanced Detection: While the individual YOLOv8 model is fast (taking only 62.6 ms), supporting real-time detection, the best ensemble configuration (Consensus Top-4) takes 384.9 ms, creating a trade-off between detection accuracy and speed; 4. Well-Balanced Performance: Some fusion strategies showed slight trade-offs in mAP for certain parts, but collectively achieved a 7% rise in F1-score, indicating a better balance between precision and recall. This research marks significant progress in smart recycling. Improved component identification allows for more efficient recovery of high-purity materials. This promotes a circular economy by ensuring that rare and strategic materials in electronics are reused instead of discarded.

InformationVol. 17(4)
The Graduate Center, CUNY (US), College of Staten Island (US), City University of New York (US)
Industry, innovation and infrastructure
Openalex Percentile: Top 6%
Advanced Neural Network Applications
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