[R2Q1] Charge Traps Revisited: From Unwanted Defects to Functional Synapses in Photosynaptic Devices

Charge trap sites have often been considered defects that induce bias stress, reduce stability, and compromise device reliability. In an out-of-the-box perspective, recent work shows that these sites can also...

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Publication Details

Journal
Nanoscale Horizons
Published
2026-01-01
DOI
https://doi.org/10.1039/d6nh00033a
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
0.00
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article

[R2Q1] Charge Traps Revisited: From Unwanted Defects to Functional Synapses in Photosynaptic Devices

Seungme Kang, S. Nam, Hocheon Yoo, Suhyeon Kim et al.
Nanoscale Horizons
Semiconductor materials and devices
article

[R2Q1] Charge Traps Revisited: From Unwanted Defects to Functional Synapses in Photosynaptic Devices

Seungme Kang, S. Nam, Hocheon Yoo, Suhyeon Kim, Hyun-Suk Kim, Benoit Hugo Lessard
article en

Abstract

Charge trap sites have often been considered defects that induce bias stress, reduce stability, and compromise device reliability. In an out-of-the-box perspective, recent work shows that these sites can also...

Nanoscale Horizons
Openalex Percentile: Top 7%
Semiconductor materials and devices
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[R2Q1] Charge Traps Revisited: From Unwanted Defects to Functional Synapses in Photosynaptic Devices — Seungme Kang, S. Nam, et al. · Nanoscale Horizons (2026) | TGRS Research Map | TGRS