CIS*FIB**: Development of the coaxial ion source* for integration into a focused ion beam** column

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SPIRE - Sciences Po Institutional REpository
Published
2025-06-16
Primary Topic
Advanced Electron Microscopy Techniques and Applications
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article
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article

CIS*FIB**: Development of the coaxial ion source* for integration into a focused ion beam** column

A. Houël, Evelyne Salançon, Marine Laurencich
SPIRE - Sciences Po Institutional REpository
Advanced Electron Microscopy Techniques and Applications
article

CIS*FIB**: Development of the coaxial ion source* for integration into a focused ion beam** column

A. Houël, Evelyne Salançon, Marine Laurencich
article en

Abstract

No abstract available for this paper.
SPIRE - Sciences Po Institutional REpository
Tescan (Czechia) (CZ), Centre National de la Recherche Scientifique (FR), Aix-Marseille Université (FR), Centre Interdisciplinaire de Nanoscience de Marseille (FR)
Openalex Percentile: Top 12%
Advanced Electron Microscopy Techniques and Applications
OpenAlex
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CIS*FIB**: Development of the coaxial ion source* for integration into a focused ion beam** column — A. Houël, Evelyne Salançon, et al. · SPIRE - Sciences Po Institutional REpository (2025) | TGRS Research Map | TGRS