Shallow‐Trap Perovskite Scintillators for High‐Resolution, Ghosting‐Free X‐Ray Imaging

ABSTRACT Solution‐processed scintillators exhibiting long‐lasting radioluminescence upon X‐ray irradiation hold great promise for flexible and high‐resolution X‐ray imaging. However, their practical implementation is typically impeded by deep electronic traps that require thermally stimulated readout at high temperature to release stored charges, leading to image ghosting and limited recyclability. Here, we report Cs 2 ZrCl 6 :Te 4+ perovskite scintillators featuring X‐ray‐induced Frenkel defect–associated shallow traps that enable long‐lasting radioluminescence at room temperature. Spectroscopic and theoretical studies reveal that X‐ray irradiation generates shallow electron–hole traps, which facilitate efficient charge capture and thermal release, producing persistent luminescence under ambient conditions. Te 4+ doping optimizes the defect landscape, stabilizing shallow traps and promoting favorable charge trapping–detrapping dynamics. By embedding these microcrystals into a flexible PDMS matrix, we fabricate a scintillating film capable of high‐resolution, ghosting‐free, time‐lapse X‐ray imaging with a spatial resolution of 18.5 lp mm −1 and recyclable imaging performance. This study highlights the potential of shallow‐trap perovskite scintillators for next‐generation flexible X‐ray imaging technologies.