Formation of Nanoscale Radiation Fluxes for X-ray Scanning Lithography

A brief description of lithographic capabilities is given at use of various radiation sources and approaches to the applying graphic drawings process organizing in the form of projection and scanning lithography. The main difficulty in implementing the creation of nanosized X-ray scanning lithography associated with the formation of nanosized X-ray beams of the required intensity is indicated, and an approach to overcoming it by using an X-ray waveguide resonance device of a special design is pointed. Experimental data characterizing the X-ray beam generated by this device are presented.

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Publication Details

Journal
Russian Microelectronics
Published
2025-12-01
DOI
https://doi.org/10.1134/s1063739725601626
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
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article

Formation of Nanoscale Radiation Fluxes for X-ray Scanning Lithography

V. K. Egorov, E. V. Egorov
Russian Microelectronics
Advanced X-ray Imaging Techniques
article

Formation of Nanoscale Radiation Fluxes for X-ray Scanning Lithography

V. K. Egorov, E. V. Egorov
article en

Abstract

A brief description of lithographic capabilities is given at use of various radiation sources and approaches to the applying graphic drawings process organizing in the form of projection and scanning lithography. The main difficulty in implementing the creation of nanosized X-ray scanning lithography associated with the formation of nanosized X-ray beams of the required intensity is indicated, and an approach to overcoming it by using an X-ray waveguide resonance device of a special design is pointed. Experimental data characterizing the X-ray beam generated by this device are presented.

Russian MicroelectronicsVol. 54(8)
Institute of Microelectronics Technology and High Purity Materials (RU), Kotelnikov Institute of Radioengineering and Electronics of the Russian Academy of Sciences (RU)
Openalex Percentile: Top 22%
Advanced X-ray Imaging Techniques
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