Tunability of Amorphous MoS <sub>2</sub> Thin Film Properties Through Pulsed KrF Laser Deposition Rate

In this study, we demonstrate how the physical properties of amorphous thin MoS<sub><i>x</i></sub> films can be controlled through pulsed laser deposition conditions. We show that the sulfur content in thin MoS<sub><i>x</i></sub> films can be specifically tuned from MoS<sub>4</sub> to MoS<sub>2</sub> by the laser fluence in the range of 1.3 to 20.4 J/cm<sup>2</sup> using a repetition rate of 1 Hz. Focusing on stoichiometric amorphous thin MoS<sub>2</sub> films, we further found that while the stoichiometry of MoS<sub>2</sub> is maintained at different repetition rates (1, 3, 5, and 10 Hz) of a pulsed KrF laser, X-ray photoelectron spectroscopy reveals a significant increase in the ratio of 1T'/2H structural units as the laser repetition rate increases. This structural shift is attributed to the increased adatom mobility and cumulative surface heating occurring at higher repetition rates, which favor the stabilization of the metastable 1T' phase while simultaneously promoting the desorption of excess polysulfides and surface molybdenum oxide impurities. Consequently, the optical parameters (refractive index and extinction coefficient) of amorphous thin MoS<sub>2</sub> films show a pronounced increase with laser frequencies ranging from 1 to 10 Hz. Furthermore, we show that higher photothermal conversion is systematically associated with an increased extinction coefficient. These findings are expected to advance both fundamental research and application-driven studies, including photothermal cancer therapy, sterilization, and disinfection.

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Journal
ACS Applied Materials & Interfaces
Published
2026-03-23
DOI
https://doi.org/10.1021/acsami.6c00013
Primary Topic
2D Materials and Applications
Type
article
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article

Tunability of Amorphous MoS 2 Thin Film Properties Through Pulsed KrF Laser Deposition Rate

Jhonatan Rodríguez‐Pereira, Miloš Krbal, Stanislav Šlang, Igor Píš et al.
ACS Applied Materials & Interfaces
2D Materials and Applications
article

Tunability of Amorphous MoS 2 Thin Film Properties Through Pulsed KrF Laser Deposition Rate

Jhonatan Rodríguez‐Pereira, Miloš Krbal, Stanislav Šlang, Igor Píš, Jan Přikryl, Vit Prokop, Jan Mistrik
article en

Abstract

In this study, we demonstrate how the physical properties of amorphous thin MoS<sub><i>x</i></sub> films can be controlled through pulsed laser deposition conditions. We show that the sulfur content in thin MoS<sub><i>x</i></sub> films can be specifically tuned from MoS<sub>4</sub> to MoS<sub>2</sub> by the laser fluence in the range of 1.3 to 20.4 J/cm<sup>2</sup> using a repetition rate of 1 Hz. Focusing on stoichiometric amorphous thin MoS<sub>2</sub> films, we further found that while the stoichiometry of MoS<sub>2</sub> is maintained at different repetition rates (1, 3, 5, and 10 Hz) of a pulsed KrF laser, X-ray photoelectron spectroscopy reveals a significant increase in the ratio of 1T'/2H structural units as the laser repetition rate increases. This structural shift is attributed to the increased adatom mobility and cumulative surface heating occurring at higher repetition rates, which favor the stabilization of the metastable 1T' phase while simultaneously promoting the desorption of excess polysulfides and surface molybdenum oxide impurities. Consequently, the optical parameters (refractive index and extinction coefficient) of amorphous thin MoS<sub>2</sub> films show a pronounced increase with laser frequencies ranging from 1 to 10 Hz. Furthermore, we show that higher photothermal conversion is systematically associated with an increased extinction coefficient. These findings are expected to advance both fundamental research and application-driven studies, including photothermal cancer therapy, sterilization, and disinfection.

ACS Applied Materials & Interfaces
University of Pardubice (CZ), Slovak Academy of Sciences (SK), Institute of Electrical Engineering of the Slovak Academy of Sciences (SK)
Openalex Percentile: Top 13%
2D Materials and Applications
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