Nanoscale Thin-Film Flexible Organic Field-Effect Transistors with Triple PMMA/SiO2/ZnO Gate Insulator Layers

Organic field-effect transistors (OFETs) incorporating a triple insulating layer of polymethyl methacrylate (PMMA), silicon dioxide (SiO₂), and zinc oxide (ZnO) were successfully fabricated on glass and on flexible PET substrates. The insulating layers significantly enhanced device performance, with the OFETs achieving field-effect mobility (<i>µ</i>) values more than twice as high as those reported in the literature. Specifically, mobility values of ~6.75 cm²/V·s were recorded on glass, ~7.14 cm²/V·s on flexible substrates before bending, and ~6.88 cm²/V·s on flexible substrates after bending. Threshold voltages (<i>V_th</i>) of -7 V and -9 V were estimated for the flexible OFETs before and after bending, respectively, along with a high on/off current ratio, exceeding 10³ for all devices. Minimal hysteresis in the transfer and output characteristics indicated excellent, trap-free interaction between the insulating layers and the pentacene. The high dielectric constant of the PMMA/SiO₂/ZnO triple insulating layers was identified as a critical factor driving the exceptional performance, stability, and low hysteresis of the OFETs. These results underscore the pivotal role of advanced insulating layers in optimizing OFET performance and durability.