Impact of higher-order exchange on the lifetime of skyrmions and antiskyrmions
Abstract Reliable control of skyrmion lifetime is essential for realizing spintronic devices, yet the role of higher-order exchange—which can lead to skyrmion stabilization—remains largely unexplored. Here we calculate lifetimes of isolated skyrmions and antiskyrmions at transition-metal interfaces based on an atomistic spin model that includes all fourth-order exchange terms. Within harmonic transition-state theory, we evaluate both energetic and entropic contributions and find substantially enhanced lifetimes when higher-order exchange is included. The four-spin four-site interaction raises the energy barrier and lowers the curvature of the energy landscape at the collapse saddle point, increasing the pre-exponential factor. We show that skyrmions and antiskyrmions can remain thermally stable even without Dzyaloshinskii-Moriya interaction (DMI), and that tuning the four-spin term by a small amount modulates the prefactor over orders of magnitude. Our results identify higher-order exchange as a promising route to stabilize topological magnetic textures—in particular in systems lacking DMI—and to engineer their thermally activated decay.
Authors
- Moritz A. Goerzen (ORCID: https://orcid.org/0000-0001-6591-3829)
- Soumyajyoti Haldar (ORCID: https://orcid.org/0000-0002-3161-4326)
- Stefan Heinze (ORCID: https://orcid.org/0000-0001-5852-0082)
- Pavel F. Bessarab (ORCID: https://orcid.org/0000-0003-3351-7172)
- Bjarne Beyer
- Hendrik Schrautzer
Institutions
- Centre National de la Recherche Scientifique (FR)
- University of Iceland (IS)
- Université Fédérale de Toulouse Midi-Pyrénées (FR)
- Linnaeus University (SE)
- Christian-Albrechts-Universität zu Kiel (DE)
- Centre d’Élaboration de Matériaux et d’Études Structurales (FR)
Publication Details
- Journal
- npj Computational Materials
- Published
- 2026-03-23
- DOI
- https://doi.org/10.1038/s41524-026-02034-9
- Primary Topic
- Magnetic properties of thin films
- Type
- article
- Field-Weighted Citation Impact
- 0.00