Anomalous tip-sample distance behavior on the tip-enhanced Raman spectroscopy of graphene in ambient conditions
Tip-enhanced Raman spectroscopy (TERS) combines Raman spectroscopy with scanning probe microscopy to overcome the spatial resolution limitation imposed by light diffraction, offering a primary optical technique for the comprehensive study of two-dimensional (2D) materials. In this work, we investigate an anomalous decay profile of the TERS intensity of the graphene 2D band as the tip-sample separation changes, observations enabled by high TERS efficiency and accuracy in tip-approach and tip-retract procedures. The anomalous results can be properly described by the addition of an ad hoc deformation to the effective tip-sample distance, rationalized here as due to the presence of a liquid meniscus formed via capillary forces.
Authors
- Bernardo Gribel Carneiro
- A. Jorio
- Luiz Gustavo Cançado (ORCID: https://orcid.org/0000-0003-0816-0888)
- Vitor Monken
- Andre G Pereira
- Raúl Correa
- Cassiano Rabelo
- Thiago L. Vasconcelos
Institutions
- Universidade Federal de Minas Gerais (BR)
- Centro Universitário de Belo Horizonte (BR)
- Instituto Nacional de Metrologia, Qualidade e Tecnologia (BR)
- D’Or Institute for Research and Education (BR)
Publication Details
- Journal
- Applied Physics Letters
- Published
- 2026-03-16
- DOI
- https://doi.org/10.1063/5.0317020
- Primary Topic
- Near-Field Optical Microscopy
- Type
- article
- Field-Weighted Citation Impact
- 0.00