Analysing the Impact of Morphological Growth Defects using Microcells

Analyzing the impact of Morphological Growth Defects on CIGS single junctions and CIGS-Perovskite tandem solar cells using Microcells. Microcells have a size of few hundred micrometers edge length and can be used to evaluate the impact of isolate morphological Growth Defects on the device performance. Electron Beam Induced Current (EBIC) measurements provide insight on the local current collection behaviour and the EBIC system is used to collect dark IV curves of Microcells.

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Publication Details

Journal
Zenodo (CERN European Organization for Nuclear Research)
Published
2025-11-07
DOI
https://doi.org/10.5281/zenodo.17866405
Primary Topic
Chalcogenide Semiconductor Thin Films
Type
article
Field-Weighted Citation Impact
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article

Analysing the Impact of Morphological Growth Defects using Microcells

Daniel Schildhammer, Christian A. Kaufmann, Nikolaus Weinberger, Nicolas Otto et al.
Zenodo (CERN European Organization for Nuclear Research)
Chalcogenide Semiconductor Thin Films
article

Analysing the Impact of Morphological Growth Defects using Microcells

Daniel Schildhammer, Christian A. Kaufmann, Nikolaus Weinberger, Nicolas Otto, Farias Basulto, Martina Harnisch, Oliver Klement
article en

Abstract

Analyzing the impact of Morphological Growth Defects on CIGS single junctions and CIGS-Perovskite tandem solar cells using Microcells. Microcells have a size of few hundred micrometers edge length and can be used to evaluate the impact of isolate morphological Growth Defects on the device performance. Electron Beam Induced Current (EBIC) measurements provide insight on the local current collection behaviour and the EBIC system is used to collect dark IV curves of Microcells.

Zenodo (CERN European Organization for Nuclear Research)
HTW Berlin - University of Applied Sciences (DE), Universität Innsbruck (AT), Helmholtz-Zentrum Berlin für Materialien und Energie (DE), Sunplugged (Austria) (AT)
Openalex Percentile: Top 33%
Chalcogenide Semiconductor Thin Films
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Analysing the Impact of Morphological Growth Defects using Microcells — Daniel Schildhammer, Christian A. Kaufmann, et al. · Zenodo (CERN European Organization for Nuclear Research) (2025) | TGRS Research Map | TGRS