Analysing the Impact of Morphological Growth Defects using Microcells
Analyzing the impact of Morphological Growth Defects on CIGS single junctions and CIGS-Perovskite tandem solar cells using Microcells. Microcells have a size of few hundred micrometers edge length and can be used to evaluate the impact of isolate morphological Growth Defects on the device performance. Electron Beam Induced Current (EBIC) measurements provide insight on the local current collection behaviour and the EBIC system is used to collect dark IV curves of Microcells.
Authors
- Daniel Schildhammer
- Christian A. Kaufmann (ORCID: https://orcid.org/0000-0001-9168-2032)
- Nikolaus Weinberger (ORCID: https://orcid.org/0000-0002-0531-5306)
- Nicolas Otto
- Farias Basulto
- Martina Harnisch (ORCID: https://orcid.org/0000-0003-2172-5943)
- Oliver Klement
Institutions
- HTW Berlin - University of Applied Sciences (DE)
- Universität Innsbruck (AT)
- Helmholtz-Zentrum Berlin für Materialien und Energie (DE)
- Sunplugged (Austria) (AT)
Publication Details
- Journal
- Zenodo (CERN European Organization for Nuclear Research)
- Published
- 2025-11-07
- DOI
- https://doi.org/10.5281/zenodo.17866405
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 0.00