Thick Charge Transport Layers Enable Amplified Spontaneous Emission and Enhanced Electroluminescence in Lossy Aluminum-Cathode Perovskite LEDs
The realization of electrically pumped perovskite lasers is currently hindered by a fundamental “cathode conflict”: noble metals like silver (Ag) are required for low optical modal loss but lack the proper work function for efficient electron injection, whereas the standard lithium fluoride/aluminum (LiF/Al) cathode ensures superior electron injection but introduces prohibitive optical absorption. Here, we present a device engineering strategy that decouples these constraints by utilizing the electron transport layer (ETL) as a geometric optical spacer. We demonstrate that increasing the ETL thickness from 40 to 200 nm effectively isolates the optical mode from the cathode interface, suppressing modal absorption. This optimization enables a perovskite LED with a standard, optically lossy LiF/Al cathode to achieve amplified spontaneous emission (ASE) under optical pumping, a milestone typically restricted to noble metal electrodes. Furthermore, under nanosecond pulsed electrical operation, the 200 nm ETL device exhibits superior electroluminescence intensity compared to conventional thin-ETL structures, attributed to enhanced charge balance and hole-blocking capabilities. This work establishes a viable pathway to integrate electrically efficient LiF/Al cathodes into low-loss optical cavities, addressing a critical trade-off toward the realization of perovskite laser diodes.
Authors
- Stephen H. Foulger (ORCID: https://orcid.org/0000-0002-4221-2154)
- Lei Zhao (ORCID: https://orcid.org/0000-0002-1779-4711)
- Kanak Kanti Bhowmik (ORCID: https://orcid.org/0009-0000-7980-0585)
- Travis Wanless
- Hai Xiao
- Lin Zhu
- Xiaolei Zhao
Institutions
- Clemson University (US)
Publication Details
- Journal
- ACS Photonics
- Published
- 2026-03-17
- DOI
- https://doi.org/10.1021/acsphotonics.5c03041
- Primary Topic
- Perovskite Materials and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00