Wavefront Engineering for Scintillation-Based Imaging
Recent research in nanophotonics for scintillation-based imaging has demonstrated promising improvements in scintillator performance. In parallel, advances in nanophotonics have enabled wavefront control through metasurfaces, a capability that has transformed fields such as microscopy by allowing tailored control of optical propagation. This naturally raises the following question, which we address in this Perspective: can wavefront-control strategies be leveraged to improve scintillation-based imaging? To answer this question, we explore nanophotonic- and metasurface-enabled wavefront control in scintillators to mitigate image blurring arising from their intrinsically diffuse light emission. While depth-of-field extension in scintillation faces fundamental limitations absent in microscopy, this approach reveals promising avenues, including stacked scintillators, selective spatial-frequency enhancement, and X-ray energy-dependent imaging. These results clarify the key distinctions in adapting wavefront engineering to scintillation and its potential to enable tailored detection strategies.
Authors
- Seou Choi (ORCID: https://orcid.org/0000-0003-3730-2152)
- Carol J. Cogswell
- Marin Soljačić (ORCID: https://orcid.org/0000-0002-7184-5831)
- Juejun Hu
- Simo Pajovic (ORCID: https://orcid.org/0000-0002-7497-3118)
- Joshua Chen (ORCID: https://orcid.org/0000-0001-7547-6503)
- William Michaels
- Charles Roques-Carmes
- Sachin Vaidya
- Louis Martin-Monier
Institutions
- University of Colorado Boulder (US)
- University of Colorado System (US)
- Moscow Institute of Thermal Technology (RU)
- Stanford University (US)
Publication Details
- Journal
- ACS Photonics
- Published
- 2026-03-16
- DOI
- https://doi.org/10.1021/acsphotonics.5c03124
- Primary Topic
- Adaptive optics and wavefront sensing
- Type
- article
- Field-Weighted Citation Impact
- 0.00