Reconstruction of Misalignment Aberrations for Cylindrical Surfaces with Complex Parameters in Pseudo Lateral Shearing Interferometry
Cylindrical surfaces with complex parameters (CSCPs) have off-axis and aspheric properties. High-precision measurement of cylindrical surfaces is a key research focus in optical metrology. Two-dimensional pseudo lateral shearing interferometry (2DPLSI) enables non-null generalized interferometry for cylindrical surfaces. However, due to the non-rotational symmetry of cylindrical surfaces with complex parameters, measuring them using two-dimensional pseudo lateral shearing interferometry inevitably introduces misalignment aberrations, degrading the accuracy of cylindrical surface reconstruction. To address this issue, we propose a novel non-null testing method: the cylindrical surface is translated in the orthogonal directions to carry out the shearing process, and wavefront errors are eliminated through second-order differencing. Furthermore, a reconstruction algorithm in one direction is proposed. Using only the partial derivative in the x direction, the wavefront error of misalignment aberrations can be reconstructed, enabling high-precision recovery of the cylindrical surface. Experimental results using a Fizeau interferometer demonstrate that the proposed method effectively reconstructs misalignment aberrations. The reconstructed cylindrical surface achieves a peak-to-valley (PV) value of 0.45λ (λ = 632.8 nm) and a root-mean-square (RMS) value of 0.12λ, comparable to the 0.37λ PV and 0.09λ RMS obtained via null testing. The repeatability of the proposed method is superior to λ/1000 RMS.
Authors
- Kuo Hai (ORCID: https://orcid.org/0009-0005-2801-6949)
- Zhongming Zang (ORCID: https://orcid.org/0000-0002-3298-9832)
- Liuqing He (ORCID: https://orcid.org/0000-0003-0213-3213)
- Siqi Zhang (ORCID: https://orcid.org/0000-0001-5541-6917)
- Le Zhao
- Weizhou Luo
- Yuxuan Ren
- Xiaodong Zhang
- Yang SC; Chen JY; Shang HF; Cheng TY; Tsou SC; Chen JR
Institutions
- Tianjin University (CN)
Publication Details
- Journal
- Sensors
- Published
- 2026-03-15
- DOI
- https://doi.org/10.3390/s26061854
- Primary Topic
- Optical measurement and interference techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00