Wavelet-based analysis for PIXE method—Study of Cr-doped UO2 spectrum
This paper presents the study of using the Wavelet Transform (WT) for Particle Induced X-ray Emission (PIXE) analysis. Wavelet transform is a mathematical method for the decomposition of the signal into time and frequency components. In a PIXE spectrum, the background is at low frequency, while the signal consists in the medium frequencies. Therefore, decomposition into different frequencies can be used to estimate the background. In this paper, the method of the Dual-Tree Complex Wavelet Transform (DTCWT) for background removal and also common data conditioning operations, such as peak finding, are investigated for their usage to Cr-doped UO 2 spectrum analysis. Employed algorithms enable the extraction and analysis of the weak features that are hidden within high-level backgrounds. Additionally, the PIXEK code is presented - a new tool using wavelet transform dedicated to PIXE analysis.
Authors
- Cyprian Mieszczyński (ORCID: https://orcid.org/0000-0002-0497-8984)
- Kazimierz Skrobas (ORCID: https://orcid.org/0000-0002-0092-7856)
- Ewelina Kucal
- F. Garrido (ORCID: https://orcid.org/0000-0002-5571-3011)
- Florian Pallier
- C. Bachelet
- J. Bourçois
Institutions
- Centre National de la Recherche Scientifique (FR)
- Université Paris-Saclay (FR)
- National Centre for Nuclear Research (PL)
- Laboratoire de Physique des 2 Infinis Irène Joliot-Curie (FR)
Publication Details
- Journal
- Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
- Published
- 2026-03-13
- DOI
- https://doi.org/10.1016/j.nimb.2026.166087
- Primary Topic
- X-ray Spectroscopy and Fluorescence Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00