Uncertainty Assessment of S-Parameters in Vector Network Analyzers Under De-Embedding Conditions

This study proposes a method to quantify uncertainty in the scattering parameter (S-parameter) measurements when using de-embedding techniques. After calibrating the measurement setup with reference standards, de-embedding algorithms are employed to extract the intrinsic S-parameter of the device under test (DUT). This process introduces additional complexity to the uncertainty analysis. This study investigates the sources of uncertainty inherent to vector network analyzer (VNA) measurements. Subsequently, a covariance matrix-based approach is employed to propagate these uncertainties, culminating in the quantification of S-parameter uncertainty. The effectiveness of the proposed is determined by comparing the measured S-parameters of power dividers and couplers to their nominal values, considering parameters such as balance, coupling, and voltage standing wave ratio (VSWR). Additionally, an uncertainty analysis is conducted for the power divider’s S-parameters, tracing the uncertainty sources back to the calibration standards.