Highly Efficient Anti-CO Poisoning Catalyst By Coupling Mo 4d–Ce 4f Electronic States to Regulate the Electronic Structure of Pt
This work presents a novel strategy for improving the anti-CO poisoning performance of Pt-based catalysts by coupling the electronic states of Mo 4d and Ce 4f to modulate the Pt electronic structure. The introduction of Mo into CeO2 creates a composite support (Mo-CeOx) that induces electron redistribution at the Pt/CeO2 interface, inducing the electronic structure modulation of Pt, thereby influencing the Pt–CO interaction. This electronic tuning not only enhances Pt’s CO tolerance but also promotes charge transfer and improves catalyst stability. Density functional theory calculations and experimental data reveal that Mo doping decreases the formation energy of oxygen vacancies, facilitating Pt stabilization and the generation of active sites. The resulting Pt/Mo-CeOx/rGO catalyst exhibits significantly enhanced methanol oxidation reaction activity, with a mass activity 4.67 times higher than that of the undoped counterpart, alongside excellent CO poisoning resistance and long-term stability. This work introduces a new paradigm for designing highly efficient and durable Pt-based catalysts by leveraging electronic state engineering, offering a powerful approach for tackling CO poisoning in electrocatalysis.
Authors
- Qingchun Wang (ORCID: https://orcid.org/0000-0003-0966-9782)
- Ge Qi Qi
- Jiaqi Cheng (ORCID: https://orcid.org/0000-0001-9745-8090)
- Yuwei Ma (ORCID: https://orcid.org/0009-0003-7239-1266)
- Junting Yang (ORCID: https://orcid.org/0009-0003-1264-4663)
- Jinxiao Bao
Institutions
- Mongolian University of Science and Technology (MN)
- Advanced Device Technology (United States) (US)
- Hunan Rare Earth Metal Material Research Institute (CN)
Publication Details
- Journal
- ACS Sustainable Chemistry & Engineering
- Published
- 2026-03-12
- DOI
- https://doi.org/10.1021/acssuschemeng.5c11985
- Primary Topic
- Catalytic Processes in Materials Science
- Type
- article
- Field-Weighted Citation Impact
- 0.00