Isotropic Reconstruction of Anisotropic vEM Volumes with ViT-Guided Diffusion
Volume electron microscopy (vEM) provides nanometer-scale 3D imaging, yet its axial (z) resolution is often much lower than the in-plane (xy) resolution, yielding anisotropic volumes that hinder segmentation and connectomic reconstruction. We present a two-stage cross-axial super-resolution framework for isotropic reconstruction that combines a conditional diffusion model and domain-specific self-supervised pretraining of a vision transformer (ViT). First, the student–teacher self-distillation paradigm of DINOv3 is adopted to learn representations from large sets of high-resolution xy sections, capturing vEM-specific texture statistics and ultrastructural patterns. Second, a conditional diffusion denoiser is trained with supervised anisotropic degradation simulated by z-downsampling, while a perceptual loss based on frozen ViT feature distances constrains generated slices to match real-section distributions. These constraints recover axial high-frequency details and reduce hallucinated textures and inter-slice drift, improving cross-slice consistency. Experiments on two public vEM datasets show improved fidelity, perceptual quality, and membrane-boundary continuity over interpolation and learning-based baselines.
Authors
- Guojia Wan (ORCID: https://orcid.org/0000-0003-3151-8606)
- Minghui Liao (ORCID: https://orcid.org/0000-0002-2583-4314)
- Zheng Zhou (ORCID: https://orcid.org/0000-0002-3124-6041)
- Xi Liu (ORCID: https://orcid.org/0000-0002-6741-4094)
- Boxue X. Du (ORCID: https://orcid.org/0000-0002-7500-1134)
- Xinyuan Li
- Junchao Qiu
Institutions
- Wuhan University (CN)
Publication Details
- Journal
- Electronics
- Published
- 2026-03-12
- DOI
- https://doi.org/10.3390/electronics15061181
- Primary Topic
- Advanced Electron Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00