Layer-Number-Dependent Metal–Insulator Transition in Topological Semimetal Nb <sub>3</sub> SiTe <sub>6</sub>
Topologically nontrivial materials are distinguished by their inherent robustness against symmetry-preserving perturbations. However, the resilience of the topologically protected degeneracies against electronic instabilities remains largely unexplored. Here, by employing transport measurements, we demonstrate a layer-number-dependent metal-insulator transition in the topological semimetal Nb<sub>3</sub>SiTe<sub>6</sub>, which has a layered structure and exhibits Fermi-liquid-like metallicity with a hole carrier density of ∼3.3 × 10<sup>21</sup> cm<sup>-3</sup> down to the bilayers. An unexpected insulating ground state only emerges in the monolayer and can be effectively tuned by electrostatic gating. The charge neutrality point coincides with a sign change of the Hall signal. Such ambipolar gating behavior contradicts the degeneracy protection under the glide-mirror symmetry in the single-particle picture. Combined with theoretical calculations, we suggest that electronic instabilities could offer a plausible mechanism for gap opening at the symmetry-protected nodal lines. Our findings provide crucial insights for understanding the rich dimension-related metal-insulator transitions in topological materials.
Authors
- Kefan Wu (ORCID: https://orcid.org/0000-0002-3108-0790)
- Z. L. Li
- Rencong Zhang
- Huiying Cui (ORCID: https://orcid.org/0009-0008-0908-5684)
- Jiaxin Zheng
- Xi Dai
- Jun Ren (ORCID: https://orcid.org/0000-0003-1267-657X)
- Yuqiang Li (ORCID: https://orcid.org/0000-0001-5264-8122)
- Ruihan Zhang (ORCID: https://orcid.org/0000-0002-7350-1370)
- Qianying Hu
- Jie Shan
- Kenji Watanabe
- Takashi Taniguchi
- Quansheng Wu
- Hongming Weng
- Zhijun Wang
- Xuan Zhao
- Qinghua Zhang
- Zhiwei Wang
- Peng Zhu
- Hong-Jun Gao
- Yang Xu
- Jingyu Yao
- Kin Fai Mak
Institutions
- Beijing Institute of Technology (CN)
- Chinese Academy of Sciences (CN)
- Hong Kong University of Science and Technology (HK)
- National Institute for Materials Science (JP)
- Cornell University (US)
- Center for NanoScience (DE)
- Guangxi Normal University (CN)
- Department of Physics, Mathematics and Informatics (BY)
- FZU ‒ Institute of Physics of the Academy of Sciences of the Czech Republic (CZ)
- National Center for Nanoscience and Technology (CN)
- Max Planck Institute for the Structure and Dynamics of Matter (DE)
- University of Chinese Academy of Sciences (CN)
- University of Hong Kong (HK)
Publication Details
- Journal
- Nano Letters
- Published
- 2026-03-12
- DOI
- https://doi.org/10.1021/acs.nanolett.5c04980
- Primary Topic
- Topological Materials and Phenomena
- Type
- article
- Field-Weighted Citation Impact
- 0.00