Layer-Number-Dependent Metal–Insulator Transition in Topological Semimetal Nb <sub>3</sub> SiTe <sub>6</sub>

Topologically nontrivial materials are distinguished by their inherent robustness against symmetry-preserving perturbations. However, the resilience of the topologically protected degeneracies against electronic instabilities remains largely unexplored. Here, by employing transport measurements, we demonstrate a layer-number-dependent metal-insulator transition in the topological semimetal Nb<sub>3</sub>SiTe<sub>6</sub>, which has a layered structure and exhibits Fermi-liquid-like metallicity with a hole carrier density of ∼3.3 × 10<sup>21</sup> cm<sup>-3</sup> down to the bilayers. An unexpected insulating ground state only emerges in the monolayer and can be effectively tuned by electrostatic gating. The charge neutrality point coincides with a sign change of the Hall signal. Such ambipolar gating behavior contradicts the degeneracy protection under the glide-mirror symmetry in the single-particle picture. Combined with theoretical calculations, we suggest that electronic instabilities could offer a plausible mechanism for gap opening at the symmetry-protected nodal lines. Our findings provide crucial insights for understanding the rich dimension-related metal-insulator transitions in topological materials.

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Publication Details

Journal
Nano Letters
Published
2026-03-12
DOI
https://doi.org/10.1021/acs.nanolett.5c04980
Primary Topic
Topological Materials and Phenomena
Type
article
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article

Layer-Number-Dependent Metal–Insulator Transition in Topological Semimetal Nb 3 SiTe 6

Kefan Wu, Z. L. Li, Rencong Zhang, Huiying Cui et al.
Nano Letters
Topological Materials and Phenomena
article

Layer-Number-Dependent Metal–Insulator Transition in Topological Semimetal Nb 3 SiTe 6

Kefan Wu, Z. L. Li, Rencong Zhang, Huiying Cui, Jiaxin Zheng, Xi Dai, Jun Ren, Yuqiang Li, Ruihan Zhang, Qianying Hu, Jie Shan, Kenji Watanabe, Takashi Taniguchi, Quansheng Wu, Hongming Weng, Zhijun Wang, Xuan Zhao, Qinghua Zhang, Zhiwei Wang, Peng Zhu, Hong-Jun Gao, Yang Xu, Jingyu Yao, Kin Fai Mak
article en

Abstract

Topologically nontrivial materials are distinguished by their inherent robustness against symmetry-preserving perturbations. However, the resilience of the topologically protected degeneracies against electronic instabilities remains largely unexplored. Here, by employing transport measurements, we demonstrate a layer-number-dependent metal-insulator transition in the topological semimetal Nb<sub>3</sub>SiTe<sub>6</sub>, which has a layered structure and exhibits Fermi-liquid-like metallicity with a hole carrier density of ∼3.3 × 10<sup>21</sup> cm<sup>-3</sup> down to the bilayers. An unexpected insulating ground state only emerges in the monolayer and can be effectively tuned by electrostatic gating. The charge neutrality point coincides with a sign change of the Hall signal. Such ambipolar gating behavior contradicts the degeneracy protection under the glide-mirror symmetry in the single-particle picture. Combined with theoretical calculations, we suggest that electronic instabilities could offer a plausible mechanism for gap opening at the symmetry-protected nodal lines. Our findings provide crucial insights for understanding the rich dimension-related metal-insulator transitions in topological materials.

Nano LettersVol. 26(11)
Beijing Institute of Technology (CN), Chinese Academy of Sciences (CN), Hong Kong University of Science and Technology (HK), National Institute for Materials Science (JP), Cornell University (US), Center for NanoScience (DE), Guangxi Normal University (CN), Department of Physics, Mathematics and Informatics (BY), FZU ‒ Institute of Physics of the Academy of Sciences of the Czech Republic (CZ), National Center for Nanoscience and Technology (CN), Max Planck Institute for the Structure and Dynamics of Matter (DE), University of Chinese Academy of Sciences (CN), University of Hong Kong (HK)
Openalex Percentile: Top 23%
Topological Materials and Phenomena
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