Simple characterization of complex stacking of semiconductors through near field imaging and spectroscop

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SPIRE - Sciences Po Institutional REpository
Published
2025-09-01
Primary Topic
Near-Field Optical Microscopy
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article
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Simple characterization of complex stacking of semiconductors through near field imaging and spectroscop

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SPIRE - Sciences Po Institutional REpository
Near-Field Optical Microscopy
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Simple characterization of complex stacking of semiconductors through near field imaging and spectroscop

Baptiste Fix, Frédéric Fossard, Grégory Vincent, Thierry Talierco, Clément Gureghian, Laure Tailpied, Jean-Sébastien Mérot
article en

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SPIRE - Sciences Po Institutional REpository
Centre National de la Recherche Scientifique (FR), Université Paris-Saclay (FR), Office National d'Études et de Recherches Aérospatiales (FR), Sorbonne Université (FR), Laboratoire d'Étude des Microstructures (FR), Institut d'Électronique et des Systèmes (FR), Institut des NanoSciences de Paris (FR)
Industry, innovation and infrastructure
Openalex Percentile: Top 37%
Near-Field Optical Microscopy
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