The Applications of <scp>MA</scp> ‐ <scp>XRF</scp> Technology in the Research of Cultural Artifacts With Curved Surface

ABSTRACT MA‐XRF technology is significant for obtaining elemental distribution information of cultural artifacts, particularly those demonstrating significant effects on the non‐visible elemental distribution caused by factors such as obstruction and corrosion. In addition to two‐dimensional plane cultural relics, such as calligraphy, paintings, and oil paintings, obtaining the surface elemental distribution of cultural relics with curved surfaces is required. This study uses a spectrometer with the capability of curved surface X‐ray fluorescence scanning imaging to analyze and study two cultural relics that require curved surface elemental distribution information. The first type is bronzeware with an inlaid gold and silver structure and a curved surface. The elemental distribution results obtained from the curved surface scanning reveal the patterns, shapes, and sizes of the inlaid gold and silver parts, which are significant in the study of inlaid gold and silver craftsmanship. The second category includes stone cultural relics. The elemental distribution information obtained from the curved surface MA‐XRF analysis provides the types of pollutants, distribution areas, and inconsistent distribution thickness, which is an important basis for analyzing the sources and components of pollutants and their removal. The above two cases provide a new technical method for studying the elemental distribution of cultural relics with curved surfaces and demonstrate the important role of MA‐XRF technology in curved surface scanning.