Automated Testbed for Evaluating SOS and DSRDs

Semiconductor opening switch (SOS) diodes are used in pulsed power systems for their ability to generate high-power, nanosecond-duration pulses. These diodes are actively being researched to evaluate their performance and identify their ideal operating characteristics. This paper presents an automated testing system developed to expand the testing capabilities for SOS diodes. The system enables repeatable testing, automatically collecting data from each shot and providing immediate analysis of key performance parameters. It also supports long-term testing to evaluate device degradation over multiple tests. The upgraded testbed allows for greater flexibility in circuit configuration and switching schemes, enabling a broader range of operating conditions for SOS diode evaluation. Results from these tests demonstrate how the automated system improves testing efficiency and supports more comprehensive analysis of device behavior. The results also indicate that the system enables exploration of conditions that improve overall device efficiency.