Interface-Enhanced Superconductivity in Ultrathin TiN Proximitized by Topological Insulators
A high-quality topological insulator-superconductor (TI-SC) heterostructure with an atomically sharp and well-controlled interface is crucial for realizing topological superconductivity and a topological quantum qubit. In particular, many studies of TI-SC heterostructures have focused on inducing a superconducting gap in the TI layer via proximity effect, while the active manipulation of superconductivity in the SC layer remains largely unexplored. In this work, we fabricated TI/TiN heterostructures using highly air-stable, ultrathin TiN films as the SC layer and observed an interface-enhanced superconductivity that contrasts with the conventional proximity effect in the superconductor-normal metal interface. Band structure measurements reveal a consistent shift of the Dirac point with <i>T</i><sub>c</sub> enhancement. Interfacial charge transfer provides a plausible explanation for this shift based on the systematic analysis and is therefore a likely contributor to the observed <i>T</i><sub>c</sub> enhancement. First-principles calculations elucidate the charge transfer pathways, highlighting the critical role of the interfacial BiTe (BiSe) bilayer. Our results not only provide a tunable TI-SC hybrid system with robust superconductivity at ultrathin thickness but also offer a potential route for manipulating superconductivity in TI-SC heterostructures via interface engineering.
Authors
- Y. Charles Cao (ORCID: https://orcid.org/0000-0001-5476-221X)
- F. Y. Zhang
- Hee Taek Yi (ORCID: https://orcid.org/0000-0002-8998-7774)
- Shufen Zhang (ORCID: https://orcid.org/0000-0003-3390-4199)
- Shaozhu Xiao (ORCID: https://orcid.org/0009-0009-8773-2039)
- Bowen Hao (ORCID: https://orcid.org/0009-0005-3523-4346)
- Jiachang Bi (ORCID: https://orcid.org/0000-0001-7374-0665)
- Rongjing Zhai
- S. Oh
- Renjie Xie
- Min Ge
- Xiong Yao
- Tong Zhou
Institutions
- Rutgers, The State University of New Jersey (US)
- University of Science and Technology of China (CN)
- Eastern Institute of Technology (NZ)
- Chinese Academy of Sciences (CN)
- Rutgers Sexual and Reproductive Health and Rights (NL)
- Technical Institute of Physics and Chemistry (CN)
- Ningbo Institute of Industrial Technology (CN)
Publication Details
- Journal
- ACS Nano
- Published
- 2026-03-05
- DOI
- https://doi.org/10.1021/acsnano.5c20630
- Primary Topic
- Surface and Thin Film Phenomena
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- Chinese Academy of Sciences
- Ningbo Municipal Bureau of Science and Technology
- National Key Research and Development Program of China
- Natural Science Foundation of Zhejiang Province