On Approach to Optimize Manufacturing of P-N-heterojunctions in Tframework of a Multilevel Inverter with R-Load to Increase their Integration Rate. On Influence Mismatch-Induced Stress

In this paper we introduce an approach to increase density of p-n-heterojunctions in the framework of a multilevel inverter with R-load. In the framework of the approach we consider manufacturing the inverter in heterostructure with specific configuration. Several required areas of the heterostructure should be doped by diffusion or ion implantation. After that dopant and radiation defects should by annealed framework optimized scheme. We also consider an approach to decrease value of mismatch-induced stress in the considered heterostructure. We introduce an analytical approach to analyze mass and heat transport in heterostructures during manufacturing of integrated circuits with account mismatch-induced stress.

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Publication Details

Journal
Zenodo (CERN European Organization for Nuclear Research)
Published
2025-01-28
DOI
https://doi.org/10.5281/zenodo.18862284
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
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article

On Approach to Optimize Manufacturing of P-N-heterojunctions in Tframework of a Multilevel Inverter with R-Load to Increase their Integration Rate. On Influence Mismatch-Induced Stress

Evgeniya Sergeevna Pankratova
Zenodo (CERN European Organization for Nuclear Research)
Silicon Carbide Semiconductor Technologies
article

On Approach to Optimize Manufacturing of P-N-heterojunctions in Tframework of a Multilevel Inverter with R-Load to Increase their Integration Rate. On Influence Mismatch-Induced Stress

Evgeniya Sergeevna Pankratova
article en

Abstract

In this paper we introduce an approach to increase density of p-n-heterojunctions in the framework of a multilevel inverter with R-load. In the framework of the approach we consider manufacturing the inverter in heterostructure with specific configuration. Several required areas of the heterostructure should be doped by diffusion or ion implantation. After that dopant and radiation defects should by annealed framework optimized scheme. We also consider an approach to decrease value of mismatch-induced stress in the considered heterostructure. We introduce an analytical approach to analyze mass and heat transport in heterostructures during manufacturing of integrated circuits with account mismatch-induced stress.

Zenodo (CERN European Organization for Nuclear Research)
N. I. Lobachevsky State University of Nizhny Novgorod (RU)
Affordable and clean energy
Openalex Percentile: Top 34%
Silicon Carbide Semiconductor Technologies
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On Approach to Optimize Manufacturing of P-N-heterojunctions in Tframework of a Multilevel Inverter with R-Load to Increase their Integration Rate. On Influence Mismatch-Induced Stress — Evgeniya Sergeevna Pankratova · Zenodo (CERN European Organization for Nuclear Research) (2025) | TGRS Research Map | TGRS