BFI-YOLO: A Lightweight Bidirectional Feature Interaction Network for Aluminum Surface Defect Detection

As a critical step in industrial quality control, surface defect detection in aluminum materials remains challenging for minor defects despite advances in deep learning. To address this, this paper proposes an enhanced YOLOv8-based model, BFI-YOLO, that incorporates a Bidirectional Multi-scale Residual Network. Specifically, we design a Bidirectional Multi-scale Feature Pyramid Network (BM-FPN) based on BiFPN to strengthen cross-scale feature fusion. The parameter-free SimAM attention module is embedded to enhance subtle defect responses while suppressing background texture interference, without introducing additional computational overhead.Furthermore, we develop a Multi-scale Residual Convolution (MSRConv) module to capture defects of varying sizes on aluminum surfaces comprehensively. MSRConv utilizes multi-scale convolutional kernels to adapt to cross-scale defect features and retains shallow details via residual connections, thereby strengthening the model’s representation of fine defects. Extensive experiments on the public TAPSDD dataset show that BFI-YOLO achieves a precision of 91.3%, a recall of 89.8%, and [email protected] of 92.1%, with only 1.8 M parameters. Compared to the baseline, BFI-YOLO reduces parameters by 40% while increasing [email protected] by 4.2%, effectively balancing detection accuracy and lightweight performance. Optimized for resource-constrained industrial platforms such as embedded systems and mobile robots, BFI-YOLO meets real-time monitoring requirements while achieving competitive detection accuracy, providing an efficient and practical solution for metal surface defect detection.

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Publication Details

Journal
Electronics
Published
2026-03-04
DOI
https://doi.org/10.3390/electronics15051080
Primary Topic
Advanced Neural Network Applications
Type
article
Field-Weighted Citation Impact
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article

BFI-YOLO: A Lightweight Bidirectional Feature Interaction Network for Aluminum Surface Defect Detection

L.‐L. SHI, Songsong Li, Weining Li, Tianyu Guo et al.
Electronics
Advanced Neural Network Applications
article

BFI-YOLO: A Lightweight Bidirectional Feature Interaction Network for Aluminum Surface Defect Detection

L.‐L. SHI, Songsong Li, Weining Li, Tianyu Guo, Qiaozhen Zhou
article en

Abstract

As a critical step in industrial quality control, surface defect detection in aluminum materials remains challenging for minor defects despite advances in deep learning. To address this, this paper proposes an enhanced YOLOv8-based model, BFI-YOLO, that incorporates a Bidirectional Multi-scale Residual Network. Specifically, we design a Bidirectional Multi-scale Feature Pyramid Network (BM-FPN) based on BiFPN to strengthen cross-scale feature fusion. The parameter-free SimAM attention module is embedded to enhance subtle defect responses while suppressing background texture interference, without introducing additional computational overhead.Furthermore, we develop a Multi-scale Residual Convolution (MSRConv) module to capture defects of varying sizes on aluminum surfaces comprehensively. MSRConv utilizes multi-scale convolutional kernels to adapt to cross-scale defect features and retains shallow details via residual connections, thereby strengthening the model’s representation of fine defects. Extensive experiments on the public TAPSDD dataset show that BFI-YOLO achieves a precision of 91.3%, a recall of 89.8%, and [email protected] of 92.1%, with only 1.8 M parameters. Compared to the baseline, BFI-YOLO reduces parameters by 40% while increasing [email protected] by 4.2%, effectively balancing detection accuracy and lightweight performance. Optimized for resource-constrained industrial platforms such as embedded systems and mobile robots, BFI-YOLO meets real-time monitoring requirements while achieving competitive detection accuracy, providing an efficient and practical solution for metal surface defect detection.

ElectronicsVol. 15(5)
Dalian Ocean University (CN)
Industry, innovation and infrastructure
Openalex Percentile: Top 36%
Advanced Neural Network Applications
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