Electrical Characterization of Transition-metal dichalcogenides using Scanning Microwave Impedance Microscopy (sMIM)

Authors

Institutions

Publication Details

Journal
ORBi UMONS
Published
2025-05-18
Primary Topic
Near-Field Optical Microscopy
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Electrical Characterization of Transition-metal dichalcogenides using Scanning Microwave Impedance Microscopy (sMIM)

Philippe Leclère, Pierre Nickmilder, Renan Barbieri Estefani, Camilla Karla Brites Queiroz Martins de Oliveira et al.
ORBi UMONS
Near-Field Optical Microscopy
article

Electrical Characterization of Transition-metal dichalcogenides using Scanning Microwave Impedance Microscopy (sMIM)

Philippe Leclère, Pierre Nickmilder, Renan Barbieri Estefani, Camilla Karla Brites Queiroz Martins de Oliveira, Alex Aparecido Ferreira, Allan Tardiolle
article en

Abstract

No abstract available for this paper.
ORBi UMONS
University of Mons (BE), Universidade Federal do Paraná (BR)
Affordable and clean energy
Openalex Percentile: Top 37%
Near-Field Optical Microscopy
OpenAlex
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Electrical Characterization of Transition-metal dichalcogenides using Scanning Microwave Impedance Microscopy (sMIM) — Philippe Leclère, Pierre Nickmilder, et al. · ORBi UMONS (2025) | TGRS Research Map | TGRS