Direct determination of the Fe3+/2+ charge-transition level in BaTiO3 and isovalently substituted Ba0.82Ca0.18Ti0.92Zr0.08O3 by x-ray photoelectron spectroscopy

Charge-transition levels of dopants in oxides and other semiconductors are key factors affecting a wide range of material properties. Despite their importance, only very few charge-transition levels are known quantitatively. This work aims to validate the direct experimental determination of charge-transition levels of dopants in oxides by means of x-ray photoelectron spectroscopy (XPS). The approach is used to derive the energy level associated with the Fe3+/2+ transition, which is determined as 2.45±0.05 eV and 2.65±0.05eV above the valence band maximum of BaTiO3 and Ba0.82Ca0.18Ti0.92Zr0.08O3, respectively. The former agrees with thermogravimetric and electric measurements. The results consolidate that XPS is a versatile and reliable technique to experimentally determine charge-transition levels, which can be used to reveal systematic dependencies on concentration, temperature, and host material. It is further demonstrated that high-temperature near-ambient pressure XPS performed at a synchrotron is ideally suited for the determination of charge-transition levels.

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Journal
Journal of Applied Physics
Published
2026-03-02
DOI
https://doi.org/10.1063/5.0310182
Primary Topic
High-pressure geophysics and materials
Type
article
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article

Direct determination of the Fe3+/2+ charge-transition level in BaTiO3 and isovalently substituted Ba0.82Ca0.18Ti0.92Zr0.08O3 by x-ray photoelectron spectroscopy

Andreas Klein, Jurij Koruza, Hebatallah Ali, Lisanne Gossel et al.
Journal of Applied Physics
High-pressure geophysics and materials
article

Direct determination of the Fe3+/2+ charge-transition level in BaTiO3 and isovalently substituted Ba0.82Ca0.18Ti0.92Zr0.08O3 by x-ray photoelectron spectroscopy

Andreas Klein, Jurij Koruza, Hebatallah Ali, Lisanne Gossel, Katharina N. S. Lohaus, Denis Sudarikov, Anna Margarethe Paulik, Melissa A. Larsson, Raoul Blume, Niklas Bertelmann, Pengcheng Hu, Savita Chaoudhary
article en

Abstract

Charge-transition levels of dopants in oxides and other semiconductors are key factors affecting a wide range of material properties. Despite their importance, only very few charge-transition levels are known quantitatively. This work aims to validate the direct experimental determination of charge-transition levels of dopants in oxides by means of x-ray photoelectron spectroscopy (XPS). The approach is used to derive the energy level associated with the Fe3+/2+ transition, which is determined as 2.45±0.05 eV and 2.65±0.05eV above the valence band maximum of BaTiO3 and Ba0.82Ca0.18Ti0.92Zr0.08O3, respectively. The former agrees with thermogravimetric and electric measurements. The results consolidate that XPS is a versatile and reliable technique to experimentally determine charge-transition levels, which can be used to reveal systematic dependencies on concentration, temperature, and host material. It is further demonstrated that high-temperature near-ambient pressure XPS performed at a synchrotron is ideally suited for the determination of charge-transition levels.

Journal of Applied PhysicsVol. 139(9)
Forschungszentrum Jülich (DE), Technische Universität Darmstadt (DE), Graz University of Technology (AT), Max Planck Institute for Chemical Energy Conversion (DE)
Affordable and clean energy
Openalex Percentile: Top 55%
High-pressure geophysics and materials
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