High-resolution broadband characterization of resonance dispersion in an optical microresonator

Accurate knowledge of the uneven free spectral range of an optical microresonator, which provides direct insight into group velocity dispersion, is essential for understanding and controlling Kerr frequency comb dynamics. In this work, we present a simple and highly precise method for measuring the free spectral range over a 5 THz bandwidth in silicon nitride microresonators, leveraging a wavemeter with 0.4 MHz resolution. Our fully fibered plug-and-play experimental setup enables accurate extraction of resonance frequencies. By carefully analyzing the spectral position of each resonance, we measure both second- and third-order free spectral range expansion coefficients. This approach offers a robust and accessible tool for dispersion characterization in integrated photonic circuits, paving the way for next generation of Kerr comb sources and quantum photonic technologies.

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Publication Details

Journal
Applied Physics Letters
Published
2026-03-02
DOI
https://doi.org/10.1063/5.0313714
Primary Topic
Advanced Fiber Laser Technologies
Type
article
Field-Weighted Citation Impact
0.00

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article

High-resolution broadband characterization of resonance dispersion in an optical microresonator

S. Olivier, Virginia D’Auria, Aimée Martin, Baptiste Routier et al.
Applied Physics Letters
Advanced Fiber Laser Technologies
article

High-resolution broadband characterization of resonance dispersion in an optical microresonator

S. Olivier, Virginia D’Auria, Aimée Martin, Baptiste Routier, Grégory Sauder, David Medina, Adrien Bensemhoun, L. Labonté, Jonathan Faugier-Tovar, Laurent Vivien, Eric Cassan, Carlos Alonso-Ramos, Quentin Wilmart, Romain Dalidet, Sébastien Tanzilli
article en

Abstract

Accurate knowledge of the uneven free spectral range of an optical microresonator, which provides direct insight into group velocity dispersion, is essential for understanding and controlling Kerr frequency comb dynamics. In this work, we present a simple and highly precise method for measuring the free spectral range over a 5 THz bandwidth in silicon nitride microresonators, leveraging a wavemeter with 0.4 MHz resolution. Our fully fibered plug-and-play experimental setup enables accurate extraction of resonance frequencies. By carefully analyzing the spectral position of each resonance, we measure both second- and third-order free spectral range expansion coefficients. This approach offers a robust and accessible tool for dispersion characterization in integrated photonic circuits, paving the way for next generation of Kerr comb sources and quantum photonic technologies.

Applied Physics LettersVol. 128(9)
Centre National de la Recherche Scientifique (FR), Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR), Université Paris-Saclay (FR), Institut des Nanotechnologies de Lyon (FR), CEA Grenoble (FR), Centre de Nanosciences et de Nanotechnologies (FR), Institut de Physique de Nice (FR), Université Grenoble Alpes (FR)
European Commission, Agence Nationale de la Recherche
Openalex Percentile: Top 38%
Advanced Fiber Laser Technologies
DOIOpen Access PDFOpenAlex
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