Electronic Evolution at the C₆₀/α-RuCl₃ Interface: Exploring a Hole Doping Scenario

We present a unified model of the electronic evolution at the C₆₀/RuCl₃ interface, constructed from systematic photoemission studies of core levels, valence band, and work function as a function of C₆₀ coverage. The data support a two-step mechanism governing interfacial physics: immediate interfacial dipole formation & long-range screening effect

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Publication Details

Journal
European XFEL Publication Database
Published
2025-09-23
Primary Topic
Electronic and Structural Properties of Oxides
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article
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article

Electronic Evolution at the C₆₀/α-RuCl₃ Interface: Exploring a Hole Doping Scenario

E. Tikhodeeva, О. В. Молодцова, Dmitrii V. Potorochin, С. Л. Молодцов et al.
European XFEL Publication Database
Electronic and Structural Properties of Oxides
article

Electronic Evolution at the C₆₀/α-RuCl₃ Interface: Exploring a Hole Doping Scenario

E. Tikhodeeva, О. В. Молодцова, Dmitrii V. Potorochin, С. Л. Молодцов, A. Koitzsch, Marieke Stapf, Martin Knupfer, Wolfgang Eberhardt, Victor Aristov, Friedrich Roth
article en

Abstract

We present a unified model of the electronic evolution at the C₆₀/RuCl₃ interface, constructed from systematic photoemission studies of core levels, valence band, and work function as a function of C₆₀ coverage. The data support a two-step mechanism governing interfacial physics: immediate interfacial dipole formation & long-range screening effect

European XFEL Publication Database
Openalex Percentile: Top 44%
Electronic and Structural Properties of Oxides
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Electronic Evolution at the C₆₀/α-RuCl₃ Interface: Exploring a Hole Doping Scenario — E. Tikhodeeva, О. В. Молодцова, et al. · European XFEL Publication Database (2025) | TGRS Research Map | TGRS