Automatic data processing and results overview during SFX experiments
Serial Femtosecond Crystallography (SFX). Crystallography at European X-ray free electron laser (XFEL): Photon pulses are bright enough to observe diffraction from extremely small crystals; Femtosecond duration of individual pulses; Sample gets destroyed shortly after diffraction; Experiments are performed serially with a continuously resupplied sample; Still images from the randomly oriented crystals; Goal - reconstruct the electron density distribution corresponding to the atomic structure.
Authors
- Diogo V. M. Melo (ORCID: https://orcid.org/0000-0002-7417-3479)
- James J. Wrigley (ORCID: https://orcid.org/0009-0003-6525-7413)
- E. V. Sobolev (ORCID: https://orcid.org/0000-0003-2478-5685)
- Thomas A. White (ORCID: https://orcid.org/0000-0002-5013-9129)
- F Dall'Antonia (ORCID: https://orcid.org/0000-0003-0799-2244)
- Cammille Carinan
- Matheus C. Teodoro
- Raphaël de Wijn
- Robert Rosca
- David Hammer
- Danilo Enoque Ferreira de Lima
- Luca Gelisio
- Thomas Michelat
- Oleksii Turkot
Publication Details
- Journal
- European XFEL Publication Database
- Published
- 2025-05-13
- Primary Topic
- Enzyme Structure and Function
- Type
- article
- Field-Weighted Citation Impact
- 0.00