Pulse-resolved Intensity and Position Measurements with Diamond Sensors at FXE of EuXFEL
The diagnostics of the X-ray beam properties has a critical importance at the European X-ray Free Electron Laser facility. Besides existing diagnostic components, utilization of a diamond sensor was proposed to achieve radiation-hard, non-invasive beam position and pulse energy measurements for hard X-rays . In particular, at very hard X-rays diamond-based sensors become a useful complement to gas-based devices which lose sensitivity due to significantly reduced gas cross-sections. The measurements presented in this work were performed with diamond sensors consisting of an electronic grade single crystal chemical-vapour-deposition (scCVD) diamond with position-sensitive resistive electrodes in a duo-lateral configuration. The first results obtained with a diamond sensor placed in XTD1 demonstrates pulse-resolved X-ray beam position within less than 1% uncertainty at 2.25 MHz . Here pulse-resolved beam intensity and position measurements performed at FXE are presented.
Authors
- Hazem Yousef (ORCID: https://orcid.org/0009-0000-7344-2529)
- Dmitry Khakhulin (ORCID: https://orcid.org/0000-0002-4453-1204)
- Christopher J. Milne (ORCID: https://orcid.org/0000-0003-4714-9139)
- Jan Grünert
- Wolfgang Freund
- Tuba Çonka Yildiz
- Jia Liu
Publication Details
- Journal
- European XFEL Publication Database
- Published
- 2024-11-14
- Primary Topic
- Diamond and Carbon-based Materials Research
- Type
- article
- Field-Weighted Citation Impact
- 0.00