Pulse-resolved Beam Position and Intensity Measurements with a Diamond Sensor at the MID Instrument of the European XFEL

There are commercially available diamond sensors for synchrotron beams, but they are incompatible for applications at X-ray Free Electron Lasers (XFEL).The European XFEL had launched a dedicated R&D project to create sensors that survive intense MHz-rate beams and deliver fast pulse-resolved position and intensity data. In particular, at very hard X-rays diamond-based sensors become a useful complement to gas-based devi-ces which lose sensitivity due to significantly reduced gas cross-sections. The sensor has an electronic grade single crystal chemical-vapour-deposition (scCVD) diamond with position-sensitive resistive electrodes in a duo-lateral configuration. The first results obtained with a diamond sensor placed in XTD1 demonstrates pulse-resolved X-ray beam position within less than 1% uncertainty at 2.25 MHz. Later recently constructed diamond sensors were tested at the Femtosecond X-ray Experiments (FXE) instrument. The measurements presented in this work were performed with these sensors at the Materials Imaging and Dynamics (MID) instrument.