MHz X-ray imaging capabilities at the EuropeanXFEL
X-ray imaging / microscopy is a well-established technique for studying systems which are opaque to optical light. The advent of high-intensity X-ray sources such as synchrotrons and X-ray free electron lasers (XFELs) has helped us to study time-resolved phenomena using X-ray microscopy. To obtain a 3D image of opaque samples, the samples are usually rotated and X-ray images taken at different orientations are subsequently processed. The process of rotation induces strain on the sample and the acquisition process itself is time consuming. With short pulse MHz XFELs like the European XFEL (EuXFEL) [1], it is now possible to do MHz X-ray Microscopy [2] with sampling at MHz repetition rates and possibility of single shot measurements. The high flux at XFELs also allows the splitting of X-ray pulses using crystals, creating multiple beams which can be used to image samples in different orientations, thus avoiding the need to rotate the sample. The multiple projection of the sample from the beamlets can be used to generate 3D images. By combining the capabilities of MHz X-ray Microscopy and multiple projection imaging, we also present Megahertz mulTiple prOjection X-ray MicrOSCOPY (MHz- TOMOSCOPY) [3,4,6] to generate 4D images of time resolved dynamics. The first TOMOSCOPY prototype was fully commissioned in April 2025 at SPB/SFX instrument of the EuXFEL. Here we present the MHz microscopy and TOMOSCOPY capabilities
Authors
- Jozef Uličný (ORCID: https://orcid.org/0000-0003-2853-8227)
- T. Sato
- Patrik Vagovič (ORCID: https://orcid.org/0000-0002-9083-6447)
- Daniel Moško
- Peter Szelses
- Pontus Fischer
- Jayanath Koliyadu
- Alke Meents
- Chan Wook Kim
- Richard Bean
- Pascal Kaul
Publication Details
- Journal
- European XFEL Publication Database
- Published
- 2026-02-05
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00