Interpretable deep learning for atomicity classification of platinum nanoclusters in STEM images

Abstract Determining the number of constituent atoms in metallic nanoclusters (NCs) directly from imaging is key to understanding how atomicity governs their size-dependent properties. Scanning transmission electron microscopy (STEM), which captures real-space images of materials with tunable magnification down to the atomic scale, provides an invaluable means to probe such structures. However, despite these advantages, automated and accurate identification of NC atomicity remains challenging, requiring robust extraction of features such as projected shape and contrast distribution from imaging data. To address this challenge, we present a deep learning framework that classifies platinum NCs (Pt n ; n = 19, 30, 41, 55, 70) using high-resolution aberration-corrected STEM images. A convolutional neural network extracts structural features that are separable in UMAP (Uniform Manifold Approximation and Projection) space, with class-specific focus visualized using Grad-CAM (Gradient-weighted Class Activation Mapping). The model achieves high accuracy, even for mixed-atomicity samples ( n = 19, 41, 70) on a shared substrate. To address domain shift, we apply fine-tuning with high-confidence pseudo-labels, significantly recovering performance. A dual-channel model integrating Local Contrast Normalization (LCN) filtering achieves a coefficient of determination of R ² = 0.94 ± 0.03, outperforming size-based classification. This framework automates atomic-scale classification from STEM images and advances autonomous workflows via real-time analysis and machine learning based decisions.

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Publication Details

Journal
npj Computational Materials
Published
2026-02-27
DOI
https://doi.org/10.1038/s41524-026-02014-z
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
0.00

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article

Interpretable deep learning for atomicity classification of platinum nanoclusters in STEM images

Naoyuki Hirata, Atsushi Nakajima, Keizo Tsukamoto, Masahide Tona
npj Computational Materials
Advanced Electron Microscopy Techniques and Applications
article

Interpretable deep learning for atomicity classification of platinum nanoclusters in STEM images

Naoyuki Hirata, Atsushi Nakajima, Keizo Tsukamoto, Masahide Tona
article en

Abstract

Abstract Determining the number of constituent atoms in metallic nanoclusters (NCs) directly from imaging is key to understanding how atomicity governs their size-dependent properties. Scanning transmission electron microscopy (STEM), which captures real-space images of materials with tunable magnification down to the atomic scale, provides an invaluable means to probe such structures. However, despite these advantages, automated and accurate identification of NC atomicity remains challenging, requiring robust extraction of features such as projected shape and contrast distribution from imaging data. To address this challenge, we present a deep learning framework that classifies platinum NCs (Pt n ; n = 19, 30, 41, 55, 70) using high-resolution aberration-corrected STEM images. A convolutional neural network extracts structural features that are separable in UMAP (Uniform Manifold Approximation and Projection) space, with class-specific focus visualized using Grad-CAM (Gradient-weighted Class Activation Mapping). The model achieves high accuracy, even for mixed-atomicity samples ( n = 19, 41, 70) on a shared substrate. To address domain shift, we apply fine-tuning with high-confidence pseudo-labels, significantly recovering performance. A dual-channel model integrating Local Contrast Normalization (LCN) filtering achieves a coefficient of determination of R ² = 0.94 ± 0.03, outperforming size-based classification. This framework automates atomic-scale classification from STEM images and advances autonomous workflows via real-time analysis and machine learning based decisions.

npj Computational Materials
Keio University (JP), Anjo Kosei Hospital (JP)
Keio University, Japan Society for the Promotion of Science
Openalex Percentile: Top 40%
Advanced Electron Microscopy Techniques and Applications
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