Polarized Incident Light Effect on the Reflection Losses at a Silicon Module Rough Glass Interface

A roughened air/glass interface of a silicon photovoltaic module offers a means of decreasing the reflection losses. This decrease depends on both the angle of the incident light and its polarization. In this paper, we concentrate on the effect of transverse electric TE and transverse magnetic TM polarized light on the amount of reflection loss. The reflectivity of light at different angles of incidence is calculated with the generalized matrix method, which analyzes the specular reflectance of mixed coherent and incoherent multilayers structures with rough interfaces. The main findings show a significant reduction of reflection losses for both TE polarized light and TM polarized light. The air/glass interfaces with root mean square higher than 200 nm present nearly the same reduction for TE polarized light and TM polarized light for every incidence angles.

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Publication Details

Journal
Bulletin of the Lebedev Physics Institute
Published
2025-12-01
DOI
https://doi.org/10.3103/s1068335625602584
Primary Topic
Thin-Film Transistor Technologies
Type
article
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article

Polarized Incident Light Effect on the Reflection Losses at a Silicon Module Rough Glass Interface

Houria Hamouche, Mohammed M. Shabat
Bulletin of the Lebedev Physics Institute
Thin-Film Transistor Technologies
article

Polarized Incident Light Effect on the Reflection Losses at a Silicon Module Rough Glass Interface

Houria Hamouche, Mohammed M. Shabat
article en

Abstract

A roughened air/glass interface of a silicon photovoltaic module offers a means of decreasing the reflection losses. This decrease depends on both the angle of the incident light and its polarization. In this paper, we concentrate on the effect of transverse electric TE and transverse magnetic TM polarized light on the amount of reflection loss. The reflectivity of light at different angles of incidence is calculated with the generalized matrix method, which analyzes the specular reflectance of mixed coherent and incoherent multilayers structures with rough interfaces. The main findings show a significant reduction of reflection losses for both TE polarized light and TM polarized light. The air/glass interfaces with root mean square higher than 200 nm present nearly the same reduction for TE polarized light and TM polarized light for every incidence angles.

Bulletin of the Lebedev Physics InstituteVol. 52(S9)
Islamic University of Gaza (PS), Renewable Energy Development Center (DZ)
Affordable and clean energy
Openalex Percentile: Top 35%
Thin-Film Transistor Technologies
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