Transfer-Function Approach to Substrate-Enhanced Diffraction Tomography
Forward and backward scattering provide complementary volumetric and interfacial information, yet conventional three-dimensional (3D) imaging typically accesses only one. In this Letter, we present a substrate-enhanced diffraction tomography approach that simultaneously recovers both channels under multi-angle epi-illumination.This geometry captures one forward- and two backward-scattering bands in axially symmetric Fourier regions, where their complementary coverage enables phase-absorption separation in a non-Hermitian spectrum. Explicit 3D transfer functions are derived for both channels, and an axial Kramers-Kronig relation is established to incorporate substrate-induced boundary conditions in a unified framework. Our results establish a label-free, high-resolution 3D imaging modality that surpasses the limits of existing methods.
Authors
- Jianpeng Ao (ORCID: https://orcid.org/0000-0002-9625-4245)
- Tongyu Li
- Ji Cheng (ORCID: https://orcid.org/0000-0003-1610-2557)
- Dashan Dong
- Danchen Jia
- Yi Shen
- Lei Tian
Publication Details
- Journal
- Optica
- Published
- 2026-02-23
- DOI
- https://doi.org/10.1364/optica.580672
- Citations
- 1
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 47.32