ZnO Doping-Induced Performance Boost in Co <sub>2</sub> TiO <sub>4</sub> /n-Si Schottky Self-Powered Photodetectors
In this study, we employed Co<sub>2</sub>TiO<sub>4</sub> and synthesized ZnO-doped Co<sub>2</sub>TiO<sub>4</sub> nanocomposites, which were utilized as interlayers in silicon-based Schottky photodetectors for optoelectronic characterization. Structural analyses using XRD, SEM, and EDX confirmed successful fabrication. The photodetectors were evaluated across a broad spectral range (351-1600 nm) and under varying light intensities. The incorporation of ZnO nanoparticles significantly enhanced the performance of the Co<sub>2</sub>TiO<sub>4</sub>-ZnO/n-Si device compared to its undoped counterpart. Notably, the responsivity (<i>R</i>) improved from 0.35 to 17.39 mA/W at 351 nm and from 1.75 to 23.76 mA/W at 1000 nm. Correspondingly, the specific detectivity increased by nearly an order of magnitude, surpassing 10<sup>10</sup> Jones across much of the spectrum. The noise equivalent power (NEP) decreased drastically from 2.16 × 10<sup>-10</sup> to 1.03 × 10<sup>-11</sup> W·Hz<sup>-1/2</sup> at 351 nm and from 4.33 × 10<sup>-11</sup> to 7.53 × 10<sup>-12</sup> W. Hz<sup>-1/2</sup> at 1000 nm, indicating enhanced sensitivity. The external quantum efficiency (EQE) also improved from 0.13 to 6.43% at 351 nm, with sustained enhancement in the UV-vis-NIR regions. Under 20 mW/cm<sup>2</sup> illumination, the Co<sub>2</sub>TiO<sub>4</sub>-ZnO/n-Si device exhibited a responsivity of 85.99 mA/W compared to 10.23 mA/W for the Co<sub>2</sub>TiO<sub>4</sub>/n-Si device, and a detectivity of 4.26 × 10<sup>10</sup> Jones, significantly higher than 1.03 × 10<sup>10</sup> Jones for the undoped counterpart. These results demonstrate that ZnO doping significantly improves light absorption, carrier transport, and signal-to-noise ratio, making the Co<sub>2</sub>TiO<sub>4</sub>-ZnO/n-Si photodetector a promising candidate for high-performance, broadband, self-powered photodetection applications.
Authors
- Faruk Özel (ORCID: https://orcid.org/0000-0002-3689-0469)
- Mehmet Okan Erdal (ORCID: https://orcid.org/0000-0003-4469-3438)
- Adem SARILMAZ
- Murat YILDIRIM
- Ali Akbar HUSSAINI
Institutions
- Selçuk University (TR)
- Recep Tayyip Erdoğan University (TR)
- Laboratoire de la Mer (FR)
- Necmettin Erbakan University (TR)
- Karamanoğlu Mehmetbey University (TR)
Publication Details
- Journal
- ACS Omega
- Published
- 2026-02-23
- DOI
- https://doi.org/10.1021/acsomega.5c12653
- Primary Topic
- Semiconductor materials and interfaces
- Type
- article
- Field-Weighted Citation Impact
- 0.00