An ontology-driven bayesian network approach to fault diagnosis and correction in manufacturing
Efficient Fault Diagnosis and Correction (FDC) is crucial for maintaining high availability in manufacturing systems. This paper presents a novel ontology-driven approach for creating Bayesian Networks (BNs) to support decision-making in FDC. An ontology is developed to represent fault knowledge from domain-specific data sources, including Failure Mode, Effects, and Criticality Analysis (FMECA) data. This ontology is used as a template for creating the BN structure. The probability parameters of the BN are identified heuristically via FMECA criticality information, deterministic relationships, and expert knowledge. A case-based evaluation using an assembly line for solenoid valves demonstrates the BN’s accurate FDC prediction performance.
Authors
- Peter Reimann (ORCID: https://orcid.org/0000-0002-3869-2239)
- Bernhard Mitschang (ORCID: https://orcid.org/0000-0003-0809-9159)
- Yannick Wilhelm
Institutions
- University of Stuttgart (DE)
- Karlsruhe Institute of Technology (DE)
- Festo (Germany) (DE)
Publication Details
- Journal
- The International Journal of Advanced Manufacturing Technology
- Published
- 2026-02-23
- DOI
- https://doi.org/10.1007/s00170-025-17136-9
- Primary Topic
- Bayesian Modeling and Causal Inference
- Type
- article
- Field-Weighted Citation Impact
- 0.00