Integrated setup for time and spatially resolved micro-photoluminescence

We report on a setup for photoluminescence (PL) spectroscopy, allowing to perform time resolved, steady-state, and spatially resolved PL and PL imaging. Time domain information (with ≈50 ps resolution) is achieved via time-correlated single photon counting (TCSPC), while the spectral information (in the ≈1-4 eV NIR-UV energy range) is accessed through a common-path interferometer based on birefringence, with the PL spectrum being retrieved via a Fourier transform approach. The micro-PL approach allows us to measure the PL signal of micron-sized samples, such as exfoliated 2D semiconductors. Moreover, the high efficiency of signal collection and analysis allows us to resolve weak PL signals from indirect-bandgap semiconductors. We measure the time-, frequency-, and spatially resolved PL on exfoliated flakes of WSe2, MoS2, and WS2 as examples to display the potential of our new apparatus.

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Publication Details

Journal
Review of Scientific Instruments
Published
2026-02-01
DOI
https://doi.org/10.1063/5.0284800
Primary Topic
2D Materials and Applications
Type
article
Field-Weighted Citation Impact
0.00

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Integrated setup for time and spatially resolved micro-photoluminescence

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Review of Scientific Instruments
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Integrated setup for time and spatially resolved micro-photoluminescence

Edvard Dobovičnik, Michele Perlangeli, G. Panaccione, A. Fondacaro, F. Parmigiani, Federico Cilento, Riccardo Cucini, Giulio Rossi, G. M. Pierantozzi, P. Sander
article en

Abstract

We report on a setup for photoluminescence (PL) spectroscopy, allowing to perform time resolved, steady-state, and spatially resolved PL and PL imaging. Time domain information (with ≈50 ps resolution) is achieved via time-correlated single photon counting (TCSPC), while the spectral information (in the ≈1-4 eV NIR-UV energy range) is accessed through a common-path interferometer based on birefringence, with the PL spectrum being retrieved via a Fourier transform approach. The micro-PL approach allows us to measure the PL signal of micron-sized samples, such as exfoliated 2D semiconductors. Moreover, the high efficiency of signal collection and analysis allows us to resolve weak PL signals from indirect-bandgap semiconductors. We measure the time-, frequency-, and spatially resolved PL on exfoliated flakes of WSe2, MoS2, and WS2 as examples to display the potential of our new apparatus.

Review of Scientific InstrumentsVol. 97(2)
University of Trieste (IT), University of Milan (IT), Elettra-Sincrotrone Trieste S.C.p.A. (IT), Istituto Officina dei Materiali (IT), Istituto Nazionale di Fisica Nucleare, Sezione di Milano (IT), Albertus-Magnus-Institut (DE), Université de Strasbourg (FR)
European Commission
Affordable and clean energy
Openalex Percentile: Top 50%
2D Materials and Applications
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