Improvement of the Simmons model for tunnel junctions

The Simmons model is a well-known and widely used model for the elastic tunneling current of a metallic tunnel junction, and fitting it to electrical measurements can be used to estimate thicknesses and heights of the tunnel barriers. We present here an improvement of the Simmons model, deriving new more accurate analytical formulas for the tunneling current density and conductance at finite voltage and temperature. We demonstrate that our conductance–voltage formulas are much closer to the Wentzel–Kramers–Brillouin approximation than the Simmons model and its commonly used simplified parabolic approximation. In addition, we demonstrate the practical use of our model, by fitting it to experimental tunnel junction conductance–voltage data and showing a sizeable difference from the Simmons model.

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Publication Details

Journal
Journal of Applied Physics
Published
2026-02-18
DOI
https://doi.org/10.1063/5.0304889
Primary Topic
Surface and Thin Film Phenomena
Type
article
Field-Weighted Citation Impact
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article

Improvement of the Simmons model for tunnel junctions

I. J. Maasilta, Ilmo Räisänen
Journal of Applied Physics
Surface and Thin Film Phenomena
article

Improvement of the Simmons model for tunnel junctions

I. J. Maasilta, Ilmo Räisänen
article en

Abstract

The Simmons model is a well-known and widely used model for the elastic tunneling current of a metallic tunnel junction, and fitting it to electrical measurements can be used to estimate thicknesses and heights of the tunnel barriers. We present here an improvement of the Simmons model, deriving new more accurate analytical formulas for the tunneling current density and conductance at finite voltage and temperature. We demonstrate that our conductance–voltage formulas are much closer to the Wentzel–Kramers–Brillouin approximation than the Simmons model and its commonly used simplified parabolic approximation. In addition, we demonstrate the practical use of our model, by fitting it to experimental tunnel junction conductance–voltage data and showing a sizeable difference from the Simmons model.

Journal of Applied PhysicsVol. 139(7)
University of Jyväskylä (FI)
Openalex Percentile: Top 49%
Surface and Thin Film Phenomena
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