Full‐Field Damage Monitoring in Architected Lattices Using In situ Electrical Impedance Tomography
ABSTRACT Electrical impedance tomography (EIT) enables non‐invasive, full‐field reconstruction of conductivity distributions, providing distributed sensing beyond point measurements. Here, we demonstrate the first in situ implementation of EIT in tunable architected lattice materials, enabling systematic exploration across a broad lattice design space and real‐time monitoring of damage evolution, including early‐stage damage preceding fracture, in 3D‐printed multifunctional composites. Voronoi‐based branch–trunk–branch lattices inspired by wallpaper symmetries are fabricated using CNT‐infused photocurable resins, with CNT dispersion confirmed by electron microscopy, and instrumented with sixteen peripheral electrodes for EIT during quasi‐static tension. Reconstructed conductivity maps resolve sequential ligament fracture with high temporal resolution, with localized conductivity loss coinciding with fracture sites, including damage remote from the electrodes. Systematic variation of lattice topology modulates EIT sensitivity to damage, demonstrating that architecture can be engineered to control spatially resolved sensing fidelity and early‐stage damage detection. Concurrent resistance measurements provide complementary spatial localization of discrete damage events, with resistance discontinuities at failure corroborating fracture progression and complementing stress–strain measurements. These results establish EIT as a distributed full‐field sensing strategy for architected multifunctional materials, demonstrating that lattice topology can be co‐designed with electrical transport to control damage‐sensing fidelity and providing a pathway toward intrinsically self‐sensing, damage‐aware material systems.
Authors
- Andrea Samorè (ORCID: https://orcid.org/0000-0001-9524-4443)
- Alistair Lee McEwan (ORCID: https://orcid.org/0000-0001-7597-6372)
- Andrew T. McBride (ORCID: https://orcid.org/0000-0001-7153-3777)
- S. Kubera Sampath Kumar (ORCID: https://orcid.org/0000-0002-0604-3015)
- Akash Deep
Institutions
- The University of Sydney (AU)
- University of Glasgow (GB)
Publication Details
- Journal
- Advanced Functional Materials
- Published
- 2026-09-28
- DOI
- https://doi.org/10.1002/adfm.78620
- Primary Topic
- Electrical and Bioimpedance Tomography
- Type
- article
- Field-Weighted Citation Impact
- 0.00