Two-axis goniometer facility for x-ray characterization of diffractors
A detailed description of a two-axis goniometer paired with an x-ray source is provided, encompassing measurements of double-crystal integrated reflectivity for diffractors employed in JET spectrometers. Polarization adjustments to these measurements are computed to estimate single-crystal integrated reflectivity. Synchronized parallel and dispersive diffractor motion profiles at this facility exhibit favorable angular error distributions, engaging all motors with deviations of ∼2 arcsec across the full range of accessible Bragg angles (0°-86°).
Authors
- A. M. Patel
Institutions
- United Kingdom Atomic Energy Authority (GB)
Publication Details
- Journal
- Review of Scientific Instruments
- Published
- 2026-02-01
- DOI
- https://doi.org/10.1063/5.0281612
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00