Fault Injection Attacks in On-Chip Interconnects: A Comparative Study of Wishbone, AXI-Lite, and AXI

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SPIRE - Sciences Po Institutional REpository
Published
2026-01-26
Primary Topic
Radiation Effects in Electronics
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article
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article

Fault Injection Attacks in On-Chip Interconnects: A Comparative Study of Wishbone, AXI-Lite, and AXI

Vianney Lapôtre, Hongwei Zhao, Gogniat Guy
SPIRE - Sciences Po Institutional REpository
Radiation Effects in Electronics
article

Fault Injection Attacks in On-Chip Interconnects: A Comparative Study of Wishbone, AXI-Lite, and AXI

Vianney Lapôtre, Hongwei Zhao, Gogniat Guy
article en

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SPIRE - Sciences Po Institutional REpository
Openalex Percentile: Top 52%
Radiation Effects in Electronics
OpenAlex
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Fault Injection Attacks in On-Chip Interconnects: A Comparative Study of Wishbone, AXI-Lite, and AXI — Vianney Lapôtre, Hongwei Zhao, et al. · SPIRE - Sciences Po Institutional REpository (2026) | TGRS Research Map | TGRS