Electronic Component Parameter Recognition by a Nonparametric Approach with an Assignment Algorithm

This study presents an automatic system to identify essential design parameters from observed features when drawing plans for electronic circuit board footprints. The system helps to reduce the error rate of manual recognition and enhances identification accuracy, thereby improving the efficiency of producing high-quality footprints and contributing to the production of superior consumer electronics. A nonparametric approach is proposed to define a score matrix for evaluating the relationships between the observed qualitative/quantitative features and the essential design parameters in a robust manner. The best matching result for the observed features and essential design parameters is obtained using an assignment algorithm with the proposed score matrix. A user-friendly sufficient condition is introduced to ensure the correct assignment produced by the proposed method. In addition, a consistent estimator of this sufficient condition is developed to facilitate practical implementation. Numerical results from the simulation study highlight the importance of this condition, demonstrating that distinct observed features can provide complementary information for accurate recognition. In the empirical study, we apply the proposed method to 15 electronic component packages and achieve satisfactory correct assignment percentages in identifying essential design parameters.

Authors

Institutions

Publication Details

Journal
Lobachevskii Journal of Mathematics
Published
2025-10-01
DOI
https://doi.org/10.1134/s1995080225609518
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Electronic Component Parameter Recognition by a Nonparametric Approach with an Assignment Algorithm

Yi-Ting Chen, Hao-Tse Hsueh, Tzung-Pei Hong, Shih-Feng Huang
Lobachevskii Journal of Mathematics
Industrial Vision Systems and Defect Detection
article

Electronic Component Parameter Recognition by a Nonparametric Approach with an Assignment Algorithm

Yi-Ting Chen, Hao-Tse Hsueh, Tzung-Pei Hong, Shih-Feng Huang
article en

Abstract

This study presents an automatic system to identify essential design parameters from observed features when drawing plans for electronic circuit board footprints. The system helps to reduce the error rate of manual recognition and enhances identification accuracy, thereby improving the efficiency of producing high-quality footprints and contributing to the production of superior consumer electronics. A nonparametric approach is proposed to define a score matrix for evaluating the relationships between the observed qualitative/quantitative features and the essential design parameters in a robust manner. The best matching result for the observed features and essential design parameters is obtained using an assignment algorithm with the proposed score matrix. A user-friendly sufficient condition is introduced to ensure the correct assignment produced by the proposed method. In addition, a consistent estimator of this sufficient condition is developed to facilitate practical implementation. Numerical results from the simulation study highlight the importance of this condition, demonstrating that distinct observed features can provide complementary information for accurate recognition. In the empirical study, we apply the proposed method to 15 electronic component packages and achieve satisfactory correct assignment percentages in identifying essential design parameters.

Lobachevskii Journal of MathematicsVol. 46(10)
National University of Kaohsiung (TW), National Central University (TW), Fooyin University (TW), National Kaohsiung University of Applied Sciences (TW)
Industry, innovation and infrastructure
Openalex Percentile: Top 26%
Industrial Vision Systems and Defect Detection
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.