Atomic Resolution Chemical Mapping of Pt-Co Nanoparticles Using STEM-EELS

STEM-EELS is a powerful quantitative technique for catalyst characterisation that allows composition to be studied at high spatial resolution. Collection of EELS signal on CCD detectors has limited the technique’s utility at higher energy losses due to high readout noise masking the low signal. New direct electron detectors for EELS remove the problem of readout noise and allow for reliable signals to be detected for more elements. We show data collected on PtCo nanoparticles with a direct electron EELS detector which allows for atomic resolution chemical mapping of Pt and Co.