Room Temperature Processed Amorphous Sn‐Excess‐ITO Electrodes for High Performance Perovskite Light‐Emitting Diodes
Achieving high efficiency perovskite light-emitting diodes (PeLEDs) requires transparent electrodes that combine low sheet resistance, high optical transmittance, and atomically smooth morphology. Conventional crystalline indium tin oxide (ITO) electrodes, however, necessitate high-temperature deposition above 300°C or post-annealing, resulting in grain boundaries and rough surfaces that are incompatible with flexible substrates and low-temperature device architecture. Here, we report room-temperature processed, grain boundary-free Sn excess doped indium tin oxide (SE-ITO) electrodes fabricated via RF-RF co-sputtering of In<sub>2</sub>O<sub>3</sub> and SnO<sub>2</sub>. Through the heavy incorporation Sn<sup>4+</sup> dopants (19 wt.%) and optimized oxygen-vacancy engineering, the amorphous SE-ITO achieves an exceptional combination of low sheet resistance (10 Ω sq<sup>-1</sup>) and high visible transmittance (85%), comparable to thermally annealed crystalline ITO. When implemented as the transparent anodes in green PeLEDs, the amorphous SE-ITO films enable a peak external quantum efficiency of 17.5% and a maximum luminance of 1860 cd m<sup>-2</sup>, outperforming devices using commercial crystalline ITO (16.3%, 1690 cd m<sup>-2</sup>). These results establish fully amorphous, room-temperature SE-ITO electrodes as a viable alternative to crystalline counterparts, offering a new pathway toward flexible, high-efficiency, and thermally compatible PeLED technologies.
Authors
- B. M. Lee
- Chang‐Shin Park
- So Mang Park
- Chang Sun Kang
- Han‐Ki Kim
- Jihun Kim
- Hyuntae Jang
- Jae Hee Lee
- Yeong‐Hyeon Seo
- Ye‐Seo Lee
- Hosuk Kang
Institutions
- Samsung (South Korea) (KR)
- Sungkyunkwan University (KR)
Publication Details
- Journal
- Small Methods
- Published
- 2026-02-15
- DOI
- https://doi.org/10.1002/smtd.202502264
- Primary Topic
- Perovskite Materials and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00